Abstract: Cell processor task management in a cell processor having a main memory, one or more power processor units (PPU) and one or more synergistic processing units (SPU), each SPU having a processor and a local memory is described. An SPU task manager (STM) running on one or more of the SPUs reads one or more task definitions stored in the main memory into the local memory of a selected SPU. Based on information contained in the task definitions the SPU loads code and/or data related to the task definitions from the main memory into the local memory associated with the selected SPU. The selected SPU then performs one or more tasks using the code and/or data.

Abstract: Methods and apparatus for cell processors are disclosed. A policy module is loaded from a main memory of a cell processor into the local memory of a selected synergistic processing unit (SPU) under control of an SPU policy module manager (SPMM) running on the SPU. A selected one or more work queues are assigned from a main memory to a selected one or more of the SPUs according to a hierarchy of precedence. A policy module for the selected one or more work queues is loaded to the selected one or more SPUs. The policy module interprets the selected one or more of the selected one or more work queues. Under control of the policy module, work from one or more of the selected one or more work queues is loaded into the local memory of the selected SPU. The work is performed with the selected SPU. After completing the work or upon a pre-emption, control of the selected SPU is returned to the SPMM.

Abstract: Cell processor task management in a cell processor having a main memory, one or more power processor units (PPU) and one or more synergistic processing units (SPU), each SPU having a processor and a local memory is described. An SPU task manager (STM) running on one or more of the SPUs reads one or more task definitions stored in the main memory into the local memory of a selected SPU. Based on information contained in the task definitions the SPU loads code and/or data related to the task definitions from the main memory into the local memory associated with the selected SPU. The selected SPU then performs one or more tasks using the code and/or data.

Abstract: A method for control over the level of detail within a rendered object is provided. The method may be a program embodied on a machine readable medium. The method identifies a set of parent vertices defining a polygon within a rendered object. A child vertex of the set of parent vertices is generated and pushed toward a predetermined location within the anticipated contours of the rendered object. One of the parent vertices is then connected to the child vertex to generate an additional polygon. A graphics engine configured to control a level of detail in a rendered object through the generation of additional polygons in the rendered object is also provided.

Abstract: A system and method for environment mapping determines a computer-generated object'reflective appearance, based upon position and orientation of a camera with respect to the object's location. An embodiment of the present invention is implemented as a real-time environment mapping for polygon rendering, however, the scope of the invention covers other rendering schemes. According to one embodiment of the present invention, a vector processing unit (VPU) uses a modified reflection formula—r=e?(e·(n+eo))(n+eo)/(1?nz)=e?(e·[nx, ny, nz?1])[nx, ny, nz?1]/(1?nz), wherein eo=[0,0,?1], and nx, ny, and nz are the components of the surface normal vector n—to compute reflective properties of an object.

Abstract: A sensor and detection system is included. The sensor includes at least one transmitter which has associated optical elements for emitting at least one light beam toward the object to be detected. At least one receiver is positioned adjacent the transmitter for receiving light reflected from an edge of the object. The receiver generates a signal responsive to the reflected light. The associated optical elements of the transmitter include a converging lens for emitting a focused light beam in one plane, and a cylindrical lens for emitting a diverging light beam in another plane, such that a portion of the reflected light is diverging and is received by the receiver over a wide angle of coverage.

Abstract: An optical measuring system capable of high resolution measurement of objects, and a method of measuring the same, are provided. The optical measuring system is formed in one integral, portable unit, and includes a laser source having associated optics for emitting a wide collimated light beam. A CCD receiver and a processor housed together and spaced apart from the laser source receive the wide collimated light beam. The CCD receiver has a plurality of diode cells, or “pixels,” formed in a linear array, and the diode cells exhibit output signals corresponding to the received light beam. The processor processes the output signals and determines a measurement associated with the output signals.

Abstract: A sensor and detection system is included. The sensor includes at least one transmitter which has associated optical elements for emitting at least one light beam toward the object to be detected. At least one receiver is positioned adjacent the transmitter for receiving light reflected from an edge of the object. The receiver generates a signal responsive to the reflected light. The associated optical elements of the transmitter include a converging lens for emitting a focused light beam in one plane, and a cylindrical lens for emitting a diverging light beam in another plane, such that a portion of the reflected light is diverging and is received by the receiver over a wide angle of coverage.

Abstract: A semiconductor wafer and magnetic disk edge detection system having a sensor unit comprising a dual beam light source spatially oriented so that the beams focus and converge at a single point external to the sensor unit, and dual light detectors spatially oriented to allow detection of light reflected from the edges of the wafers and disks even where the angle of incidence of the light onto the edge deviates significantly from the perpendicular. The sensor unit works in operative combination with a scanning motion means to move the sensor across the edges of the wafers or disks to be detected, typically by attachment of the sensor unit to a linear motor or a robotic arm, or alternately, by manually detecting the edges of the wafers and disks.