Patents by Inventor Mark D. Heerema

Mark D. Heerema has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for providing signal analysis data
    Patent number: 8860400
    Abstract: A method for displaying signal analysis data comprises performing a plurality of sweep operations upon a received signal. With the sweep operations, spectral analysis is performed upon a first frequency band of the received signal. Displays are rendered of data generated from the spectral analysis in the first band and a second band different from the first band simultaneously, and the displays in the first band and the second bands are updated according to the sweep operations.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: October 14, 2014
    Assignee: Agilent Technologies, Inc.
    Inventors: Mark D. Heerema, Corydon J. Boyan, Gordon Strachan
  • SYSTEMS AND METHODS FOR PROVIDING SIGNAL ANALYSIS DATA
    Publication number: 20090085555
    Abstract: A method for displaying signal analysis data comprises performing a plurality of sweep operations upon a received signal. With the sweep operations, spectral analysis is performed upon a first frequency band of the received signal. Displays are rendered of data generated from the spectral analysis in the first band and a second band different from the first band simultaneously, and the displays in the first band and the second bands are updated according to the sweep operations.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 2, 2009
    Inventors: Mark D. Heerema, Corydon J. Boyan, Gordon Strachan
  • Frequency-tuneable filter calibration
    Patent number: 4858159
    Abstract: An apparatus and method for calibrating a yttrium-iron-garnet-tuned filter (YTF) is disclosed. Instead of using both tune+span information from the 1st LO, only the sweep ramp used to span the 1st LO is used for the YTF's s own swept spans, and the YTF has its own tune information created independently of tune of the YIG oscillator. This allows calibration at any time, both in the factory or in the field.
    Type: Grant
    Filed: October 19, 1987
    Date of Patent: August 15, 1989
    Assignee: Hewlett-Packard Company
    Inventors: Lynn M. Wheelwright, Vicky A. Hansen, Mark D. Heerema