Patents by Inventor Mark D. Ingram

Mark D. Ingram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260023648
    Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. For example, a memory device may include health monitoring logic operable to activate certain internal health monitors of a set of multiple monitors and to communicate an output associated with the activated monitors. In a first mode of operation, the health monitoring logic may provide a single output that is generated from multiple outputs of the set of monitors. In a second mode of operation, the health monitoring logic may cycle through certain monitors (e.g., in a test mode), and may generate an output corresponding to respective active monitors as it cycles through the set of monitors. The health monitoring logic may communicate an output specific to each monitor to a host device such that the host device may evaluate an output from each monitor of the set of monitors.
    Type: Application
    Filed: September 26, 2025
    Publication date: January 22, 2026
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum
  • Patent number: 12461693
    Abstract: Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
    Type: Grant
    Filed: April 10, 2024
    Date of Patent: November 4, 2025
    Assignee: Micron Technology, Inc.
    Inventors: Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Publication number: 20250328289
    Abstract: Methods, systems, and devices for operating frequency monitoring for memory devices are described for monitoring one or more operating frequency ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more operating frequency ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
    Type: Application
    Filed: May 6, 2025
    Publication date: October 23, 2025
    Inventors: Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Patent number: 12443486
    Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. For example, a memory device may include health monitoring logic operable to activate certain internal health monitors of a set of multiple monitors and to communicate an output associated with the activated monitors. In a first mode of operation, the health monitoring logic may provide a single output that is generated from multiple outputs of the set of monitors. In a second mode of operation, the health monitoring logic may cycle through certain monitors (e.g., in a test mode), and may generate an output corresponding to respective active monitors as it cycles through the set of monitors. The health monitoring logic may communicate an output specific to each monitor to a host device such that the host device may evaluate an output from each monitor of the set of monitors.
    Type: Grant
    Filed: May 31, 2024
    Date of Patent: October 14, 2025
    Assignee: Micron Technology, Inc.
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum
  • Publication number: 20250258746
    Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. A memory device may include health monitoring logic that is operable to be enabled in a configuration that corresponds to an output, such as an expected output, regardless of a degradation level of the memory device. Such a configuration may be enabled in a mode, such as a test mode, during which the memory device, or a host device coupled with the memory device, or some combination, may evaluate a difference between the output and an actual output of the health monitoring logic. The actual output being the same as the output may provide an indication that at least a portion of the health monitoring logic is functioning properly, and the actual output being different than the output may provide an indication that at least a portion of the health monitoring logic is not functioning properly.
    Type: Application
    Filed: April 30, 2025
    Publication date: August 14, 2025
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Todd Jackson Plum, Mark D. Ingram, Scott D. Van De Graaff
  • Publication number: 20250258623
    Abstract: Methods, systems, and devices for inter-device communications for memory health monitoring are described. These communications relate to a host device that is associated with a memory device that monitors and reports health information (e.g., one or more parameters associated with a status of the memory device). The memory device may transmit the health information to the host device (e.g., a vehicle or a computer of the vehicle), which may perform one or more operations and transmit the health information to another entity of a system (e.g., ecosystem) including the host device. The host device may additionally or alternatively use the health information. In some cases, the other entity may receive the health information and transmit a signal back to the host device based on the health information. The other entity of the ecosystem may receive the health information and may make a determination based on the health information.
    Type: Application
    Filed: April 28, 2025
    Publication date: August 14, 2025
    Inventors: Aaron P. Boehm, Mark D. Ingram, Scott E. Schaefer, Scott D. Van De Graaff, Todd J. Plum
  • Publication number: 20250199710
    Abstract: Methods, systems, and devices for operational monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a memory device may include components configured for monitoring health or life expectancy or both of the memory device, such as components internal to the memory device that identify and store various indications of a duration of operating a memory device. An operational duration stored at the memory device may be used in various operations, such as calculations or comparisons, to evaluate health or life expectancy of the memory device, which may include or be supported by various signaling with a host device.
    Type: Application
    Filed: December 17, 2024
    Publication date: June 19, 2025
    Inventors: Aaron P. Boehm, Todd J. Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Publication number: 20250157514
    Abstract: Methods, systems, and devices for memory traffic monitoring are described. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a characteristic related to an operational bias of circuits of the memory device. The memory device may use the characteristic (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.
    Type: Application
    Filed: November 20, 2024
    Publication date: May 15, 2025
    Inventors: Aaron P. Boehm, Scott E. Schaefer, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum
  • Patent number: 12299325
    Abstract: Methods, systems, and devices for operating frequency monitoring for memory devices are described for monitoring one or more operating frequency ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more operating frequency ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: May 13, 2025
    Assignee: Micron Technology, Inc.
    Inventors: Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Patent number: 12189974
    Abstract: Methods, systems, and devices for operational monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a memory device may include components configured for monitoring health or life expectancy or both of the memory device, such as components internal to the memory device that identify and store various indications of a duration of operating a memory device. An operational duration stored at the memory device may be used in various operations, such as calculations or comparisons, to evaluate health or life expectancy of the memory device, which may include or be supported by various signaling with a host device.
    Type: Grant
    Filed: June 11, 2021
    Date of Patent: January 7, 2025
    Assignee: Micron Technology, Inc.
    Inventors: Aaron P. Boehm, Todd J. Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Patent number: 12165740
    Abstract: Methods, systems, and devices for memory traffic monitoring are described. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a characteristic related to an operational bias of circuits of the memory device. The memory device may use the characteristic (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.
    Type: Grant
    Filed: August 22, 2022
    Date of Patent: December 10, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Aaron P. Boehm, Scott E. Schaefer, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum
  • Publication number: 20240345932
    Abstract: Methods, systems, and devices for memory device health monitoring logic are described. In accordance with examples as disclosed herein, a memory device may include health monitoring logic configured to monitor a degradation level of the memory device. Further, the health monitoring logic may include a self-check logic to monitor the degradation level of the health monitoring logic. Using the health monitoring logic, the memory device may evaluate and store a health state of the memory device, which may be used to flag a fault in the memory device, among other responsive operations. Additionally, using the self-check logic, the memory device may evaluate and store a health state of the health monitoring logic, which may be used to flag a fault of the previously evaluated health state of the memory device. Based on the self-check flag, a host device may halt or adjust the response operations associated with the memory device.
    Type: Application
    Filed: April 9, 2024
    Publication date: October 17, 2024
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Todd Jackson Plum, Mark D. Ingram, Scott D. Van De Graaff
  • Publication number: 20240320093
    Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. For example, a memory device may include health monitoring logic operable to activate certain internal health monitors of a set of multiple monitors and to communicate an output associated with the activated monitors. In a first mode of operation, the health monitoring logic may provide a single output that is generated from multiple outputs of the set of monitors. In a second mode of operation, the health monitoring logic may cycle through certain monitors (e.g., in a test mode), and may generate an output corresponding to respective active monitors as it cycles through the set of monitors. The health monitoring logic may communicate an output specific to each monitor to a host device such that the host device may evaluate an output from each monitor of the set of monitors.
    Type: Application
    Filed: May 31, 2024
    Publication date: September 26, 2024
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum
  • Patent number: 12066927
    Abstract: Methods, systems, and devices for adaptive user defined health indications are described. A host device may be configured to dynamically indicate adaptive health flags for monitoring health and wear information for a memory device. The host device may indicate, to a memory device, a first index. The first index may correspond to a first level of wear of a set of multiple indexed levels of wear for the memory device. The memory device may determine that a metric of the memory device satisfies the first level of wear and indicate, to the host device, that the first level of wear is satisfied. The host device may receive the indication that the first level of wear is satisfied and indicate, to the memory device, a second level of wear of the set of indexed levels of wear that is different than the first level of wear.
    Type: Grant
    Filed: January 5, 2023
    Date of Patent: August 20, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Aaron P. Boehm, Todd Jackson Plum, Mark D. Ingram, Scott E. Schaefer, Scott D. Van De Graaff
  • Publication number: 20240256187
    Abstract: Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
    Type: Application
    Filed: April 10, 2024
    Publication date: August 1, 2024
    Inventors: Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Patent number: 12038806
    Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. For example, a memory device may include health monitoring logic operable to activate certain internal health monitors of a set of multiple monitors and to communicate an output associated with the activated monitors. In a first mode of operation, the health monitoring logic may provide a single output that is generated from multiple outputs of the set of monitors. In a second mode of operation, the health monitoring logic may cycle through certain monitors (e.g., in a test mode), and may generate an output corresponding to respective active monitors as it cycles through the set of monitors. The health monitoring logic may communicate an output specific to each monitor to a host device such that the host device may evaluate an output from each monitor of the set of monitors.
    Type: Grant
    Filed: June 20, 2022
    Date of Patent: July 16, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum
  • Patent number: 12014792
    Abstract: Methods, systems, and devices for monitoring and adjusting access operations at a memory device are described to support integrating monitors or sensors for detecting memory device health issues, such as those resulting from device access or wear. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a metric related to access operations for the memory device. The memory device may use the metric (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.
    Type: Grant
    Filed: February 10, 2023
    Date of Patent: June 18, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Mark D. Ingram, Todd Jackson Plum, Scott E. Schaefer, Aaron P. Boehm, Scott D. Van De Graaff
  • Patent number: 11977772
    Abstract: Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: May 7, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Scott E. Schaefer, Mark D. Ingram
  • Patent number: 11947806
    Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. A memory device may monitor a parameter of a component of the memory device or the memory device overall, and may determine whether the parameter satisfies a threshold. The parameter may represent or be associated with a lifetime of the component, a level of wear of the component, or an operating parameter violation of the component, or any combination thereof. The memory device may communicate, to a host device, an indication of the parameter satisfying the threshold, and the host device may use the information in the indication to adjust one or more parameters associated with operating the memory device, among other example operations.
    Type: Grant
    Filed: October 19, 2021
    Date of Patent: April 2, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Scott E. Schaefer, Aaron P. Boehm, Scott D. Van De Graaff, Todd J. Plum, Mark D. Ingram
  • Patent number: 11880291
    Abstract: Methods, systems, and devices for monitoring and reporting a status of a memory device are described. A memory device may include monitoring circuitry that may be configured to monitor health and wear information for the memory device. A host device may write to a dedicated register of the memory device, to configure the memory device with health status information reporting parameters. The memory device may monitor and report the health status information of the memory device based on the received reporting configuration or based on a default configuration, and may write one or more values indicative of the health status information to a dedicated register. The host device may perform a read on the readout register to obtain the health status information, as indicated by the one or more values, and may adjust operating procedures or take other actions based on the received health status information.
    Type: Grant
    Filed: June 22, 2021
    Date of Patent: January 23, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Todd Jackson Plum, Scott D. Van De Graaff, Scott E. Schaefer, Aaron P Boehm, Mark D. Ingram