Patents by Inventor Mark D. Roos

Mark D. Roos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4872212
    Abstract: An electronic device which includes multiple components separately housed in electromagnetically isolating modular units, which units are interchangeably and detachably mounted in a frame. The frame and modular units are formed to releasably connect the various components to sources of electrical and/or microwave energy.
    Type: Grant
    Filed: May 15, 1987
    Date of Patent: October 3, 1989
    Assignee: EIP Microwave, Inc.
    Inventors: Mark D. Roos, Walter J. Messmer, III
  • Patent number: 4839578
    Abstract: A method for removing phase errors from RF signals generated by movement of the cable interconnecting a network analyzer and a device under test. The method includes the steps of measuring the phase difference between incident and reflected signals during calibration to establish a reference, measuring the phase difference between incident and reflected signals during device testing, comparing this result to the reference to generate an error signal from phase correction.
    Type: Grant
    Filed: June 4, 1987
    Date of Patent: June 13, 1989
    Assignee: EIP Microwave, Inc.
    Inventor: Mark D. Roos
  • Patent number: 4813886
    Abstract: A microwave device including various electromagnetically isolated components assembled with a microwave distribution bar in a single housing. A microwave distribution bar is formed to distribute microwave energy to those individual components which are selectively connected thereto.
    Type: Grant
    Filed: April 10, 1987
    Date of Patent: March 21, 1989
    Assignee: EIP Microwave, Inc.
    Inventors: Mark D. Roos, Walter J. Messmer, III
  • Patent number: 4803419
    Abstract: A testing head for attachment between a cable connected to a source of microwave test signals and a microwave device to be tested. In the testing head an appropriate sampling of transmitted and reflected test signals is accomplished, along with mixing thereof with a local oscillator signal to generate an intermediate frequency signal, which is then returned to a network analyzer for appropriate processing.
    Type: Grant
    Filed: October 1, 1986
    Date of Patent: February 7, 1989
    Assignee: EIP Microwave, Inc.
    Inventor: Mark D. Roos
  • Patent number: 4800464
    Abstract: A modular electronic shielding assembly having a housing in which a ground plane platform is held. The housing is formed from a conductive material which provides for electromagnetic isolation. The ground plane platform also provides for electromagnetic isolation by having disposed on one side thereof a conductive layer. This ground plane platform separates the housing into two electromagnetically isolated compartments. The ground plane platform has electronic circuitry formed upon that surface opposite the conductive layer, which circuitry is isolated from the microwave components by one of two techniques. The first involves mounting the components to the opposite surface of the platform which carries the conductive layer, or by forming the components on one side of a daughterboard with the opposite side bearing a conductive layer. The daughterboard is mounted on that platform surface bearing the circuitry with the daughterboard conductive surface facing the circuitry.
    Type: Grant
    Filed: February 5, 1988
    Date of Patent: January 24, 1989
    Assignee: EIP Microwave, Inc.
    Inventors: Mark D. Roos, Walter J. Messmer, III
  • Patent number: 4758775
    Abstract: The present invention relates to microwave measurement systems and more particularly to a microwave network analyzer having a measurement head connectable between a source of radio frequency energy and a device under test which head is capable of operating over an extended band of radio frequency energy.
    Type: Grant
    Filed: April 10, 1987
    Date of Patent: July 19, 1988
    Assignee: EIP Microwave, Inc.
    Inventor: Mark D. Roos
  • Patent number: 4661767
    Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: April 28, 1987
    Assignee: Hewlett-Packard Company
    Inventors: David D. Sharrit, Michael J. Neering, S. Bruce Donecker, Mark D. Roos, Wayne C. Cannon, John T. Barr, IV
  • Patent number: 4647847
    Abstract: A method is provided to eliminate harmonic skip problems in a down-conversion system. The method makes use of the relationship between the frequency of the intermediate frequency signal and the harmonic number of the local oscillator signal with respect to the frequency of the frequency of the source signal. By monitoring and measuring corresponding changes in the intermediate frequency signal caused by predetermined changes in the frequency of the local oscillator signal, a determination of the proper local oscillator signal and the proper harmonic can be made using a processor. The proper frequency and harmonic can then be maintained by periodically checking the relationship between variables.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: March 3, 1987
    Assignee: Hewlett-Packard Company
    Inventor: Mark D. Roos
  • Patent number: 4636717
    Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: January 13, 1987
    Assignee: Hewlett-Packard Company
    Inventors: David D. Sharrit, Robert G. Dildine, Mark D. Roos, John T. Barr, IV