Patents by Inventor Mark D. Windoloski

Mark D. Windoloski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10416118
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: September 17, 2019
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark D Windoloski
  • Patent number: 7812601
    Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
    Type: Grant
    Filed: June 15, 2009
    Date of Patent: October 12, 2010
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
  • Patent number: 7696748
    Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: April 13, 2010
    Assignee: Jentek Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Andrew P. Washabaugh, Vladimir Tsukernik, Mark D. Windoloski, Ian C. Shay
  • Publication number: 20100026285
    Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
    Type: Application
    Filed: June 15, 2009
    Publication date: February 4, 2010
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
  • Patent number: 7518360
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: April 14, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark D. Windoloski, Christopher Root, Vladimir A. Zilberstein, David C. Grundy, Vladimir Tsukernik
  • Patent number: 7451639
    Abstract: A set of curved components, such as the dovetail region of engine blades, are inspected by mounting each component into a circular carousel in a vertical orientation and rotating the carousel to move each component toward and away from an inspection site. The inspection site clamps a flexible eddy current sensor array to the curved material surface, scans the array over the surface, records the sensor position. A rigid element having a surface geometry similar to the surface shape of the component can be attached to the component to facilitate scanning of the sensor array over a component edge. The response of each sense element in the array may be converted into an effective material property and sense element proximity to the component material surface to verify the quality of the inspection scan and the presence of a defect such as a crack.
    Type: Grant
    Filed: March 7, 2007
    Date of Patent: November 18, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Mark D Windoloski, Vladimir B Tsukernik, Darrell E Schlicker, Todd M Dunford, Andrew P. Washabaugh
  • Publication number: 20080258720
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Application
    Filed: June 1, 2007
    Publication date: October 23, 2008
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark D. Windoloski, Christopher Root, Vladimir A. Zilberstein, David C. Grundy, Vladimir Tsukernik
  • Patent number: 7289913
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: October 30, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
  • Patent number: 7188532
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Grant
    Filed: September 8, 2004
    Date of Patent: March 13, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian C. Shay, Robert J. Lyons, Christopher A. Craven, Christopher Root, Mark D. Windoloski, Volker Weiss
  • Publication number: 20040004475
    Abstract: Apparatus and methods are described for the improved throughput and increased reliability for inspection of critical surfaces on aircraft engine disks. Eddy current sensor arrays allow two-dimensional images to be generated for detection of cracks in regions with fretting damage. Background variations due to fretting damage and stress variations are also accommodated. These arrays are combined with instrumentation that permits parallel data acquisition for each sensing element and rapid inspection rates. Inflatable support structures behind the sensor array improve sensor durability and reduce fixturing requirements for the inspection.
    Type: Application
    Filed: April 18, 2003
    Publication date: January 8, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, J. Stephen Cargill, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh, Vladimir Tsukernik, David C. Grundy, Mark D. Windoloski
  • Publication number: 20030164700
    Abstract: This invention relates to apparatus for the nondestructive measurements of materials. New eddy current sensing arrays and methods are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects and flaws around features such as fasteners. The arrays incorporate unique layouts for the sensing elements, generally have essentially identical sensor arrays with sensing elements aligned in proximity to the drive elements, and conductive pathways that promote cancellation of undesired magnetic flux. These features enable the use of small sense elements that permits high resolution imaging of material properties.
    Type: Application
    Filed: January 15, 2003
    Publication date: September 4, 2003
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Mark D. Windoloski, David C. Grundy, Ian C. Shay