Patents by Inventor Mark Darus

Mark Darus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample preparation
    Patent number: 7511282
    Abstract: Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: March 31, 2009
    Assignee: FEI Company
    Inventors: Enrique Agorio, Michael Tanguay, Christophe Roudin, Liang Hong, Jay Jordan, Craig Henry, Mark Darus
  • Sample Preparation
    Publication number: 20070272854
    Abstract: Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
    Type: Application
    Filed: May 25, 2006
    Publication date: November 29, 2007
    Inventors: Enrique Agorio, Michael Tanguay, Christophe Roudin, Liang Hong, Jay Jordan, Craig Henry, Mark Darus