Patents by Inventor Mark Donahue

Mark Donahue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for ion beam angle measurement in two dimensions
    Patent number: 7394073
    Abstract: An angle measurement system for an ion beam includes a flag defining first and second features, wherein the second feature has a variable spacing from the first feature, a mechanism to translate the flag along a translation path so that the flag intercepts at least a portion of the ion beam, and a sensing device to detect the ion beam for different flag positions along the translation path and produce a sensor signal in response to the detected ion beam. The sensor signal and corresponding positions of the flag are representative of a vertical beam angle of the ion beam in a vertical plane. The sensing device may include a mask and a mechanism to translate the mask in order to define a beam current sensor on a portion of an associated Faraday sensor.
    Type: Grant
    Filed: January 20, 2006
    Date of Patent: July 1, 2008
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: James J. Cummings, Joseph Olson, Arthur H. Clough, Eric Hermanson, Rosario Mollica, Paul J. Murphy, Mark Donahue
  • Methods & apparatus for ion beam angle measurement in two dimensions
    Publication number: 20060289798
    Abstract: An angle measurement system for an ion beam includes a flag defining first and second features, wherein the second feature has a variable spacing from the first feature, a mechanism to translate the flag along a translation path so that the flag intercepts at least a portion of the ion beam, and a sensing device to detect the ion beam for different flag positions along the translation path and produce a sensor signal in response to the detected ion beam. The sensor signal and corresponding positions of the flag are representative of a vertical beam angle of the ion beam in a vertical plane. The sensing device may include a mask and a mechanism to translate the mask in order to define a beam current sensor on a portion of an associated Faraday sensor.
    Type: Application
    Filed: January 20, 2006
    Publication date: December 28, 2006
    Applicant: Varian Semiconductor Equipment Associates, Inc.
    Inventors: James Cummings, Joseph Olson, Arthur Clough, Eric Hermanson, Rosario Mollica, Paul Murphy, Mark Donahue
  • Apparatus and method for testing non-deterministic device data
    Patent number: 6990423
    Abstract: Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.
    Type: Grant
    Filed: June 25, 2003
    Date of Patent: January 24, 2006
    Assignee: Teradyne, Inc.
    Inventors: Benjamin Brown, Peter Huber, Mark Donahue, John Pane
  • Apparatus and method for testing non-deterministic device data
    Publication number: 20040267487
    Abstract: Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.
    Type: Application
    Filed: June 25, 2003
    Publication date: December 30, 2004
    Inventors: Benjamin Brown, Peter Huber, Mark Donahue, John Pane