Patents by Inventor Mark E. Beyer

Mark E. Beyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7623996
    Abstract: Disclosed is a system and process for creating mass property models for new product designs. Engineers are able to use this robust model to perform various assessments. The system morphs legacy mass property values into new design project configurations. This is done by building linear transformations in four-dimensional homogeneous coordinates. The transformations capture source and target geometric characteristic shapes. Filtering techniques are used to retrieve relevant source mass properties from the database. These detailed mass properties are collected into bay wise functional groups and then converted to equivalent mass particulates. These point masses are transformed from the source domain to the target domain, and summed back together to generate target mass property data. The process outputs detailed mass property distributions used in engineering models and reports and is continually updated to accommodate detailed designs throughout project development.
    Type: Grant
    Filed: October 21, 2005
    Date of Patent: November 24, 2009
    Assignee: Textron Innovations, Inc.
    Inventor: Mark E. Beyer