Patents by Inventor Mark E. Hardman
Mark E. Hardman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11056330Abstract: An electrospray ion source comprises: a needle capillary comprising a spray tip end and an opposite end; a nebulizing gas channel parallel to the needle capillary; an auxiliary gas channel parallel to the needle capillary; a heater parallel to a length of the auxiliary gas channel; a thermally conductive heat transfer member parallel to a length of the needle capillary and disposed between the needle capillary and the heater, said heat transfer member having a first end adjacent to the spray tip end of the needle capillary and a second end opposite to the first end; and a cooled heat sink member in thermal contact with the second end of the heat transfer member.Type: GrantFiled: December 21, 2018Date of Patent: July 6, 2021Assignee: THERMO FINNIGAN LLCInventors: Oleg Silivra, Mark E. Hardman
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Publication number: 20200203141Abstract: An electrospray ion source comprises: a needle capillary comprising a spray tip end and an opposite end; a nebulizing gas channel parallel to the needle capillary; an auxiliary gas channel parallel to the needle capillary; a heater parallel to a length of the auxiliary gas channel; a thermally conductive heat transfer member parallel to a length of the needle capillary and disposed between the needle capillary and the heater, said heat transfer member having a first end adjacent to the spray tip end of the needle capillary and a second end opposite to the first end; and a cooled heat sink member in thermal contact with the second end of the heat transfer member.Type: ApplicationFiled: December 21, 2018Publication date: June 25, 2020Inventors: Oleg SILIVRA, Mark E. HARDMAN
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Patent number: 8692190Abstract: A system for analyzing ions comprises: an ion source; a FAIMS cell comprising: (a) a gas inlet; (b) an outer electrode having a generally concave inner surface and comprising: (i) an ion inlet operable to receive the ions from the ion source and a carrier gas from the gas inlet; and (ii) an ion outlet; and (c) an inner electrode having a conduit therethrough and having a generally convex outer surface disposed in a spaced-apart and facing arrangement relative to the inner surface of the outer electrode defining at least one annular on separation region therebetween; and a mass analyzer for mass analyzing ions transmitted by the FAIMS cell through the ion outlet, wherein the inner electrode is moveable between a first position and a second position, the first and second positions facilitating movement of the ions through the at least one annular ion separation region and the conduit, respectively.Type: GrantFiled: March 23, 2012Date of Patent: April 8, 2014Assignee: Thermo Finnigan LLCInventors: Michael W. Belford, Jean-Jacques Dunyach, Mark E. Hardman
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Publication number: 20120181424Abstract: A system for analyzing ions comprises: an ion source; a FAIMS cell comprising: (a) a gas inlet; (h) an outer electrode having a generally concave inner surface and comprising: (i) an ion inlet operable to receive the ions from the ion source and a carrier gas from the gas inlet; and (ii) an ion outlet; and (c) an inner electrode having a conduit therethrough and having a generally convex outer surface disposed in a spaced-apart and facing arrangement relative to the inner surface of the outer electrode defining at least one annular on separation region therebetween; and a mass analyzer for mass analyzing ions transmitted by the FAIMS cell through the ion outlet, wherein the inner electrode is moveable between a first position and a second position, the first and second positions facilitating movement of the ions through the at least one annular ion separation region and the conduit, respectively.Type: ApplicationFiled: March 23, 2012Publication date: July 19, 2012Inventors: Michael W. BELFORD, Jean-Jacques DUNYACH, Mark E. HARDMAN
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Patent number: 8158932Abstract: A system for analyzing ions comprises: an ion source; a FAIMS cell comprising: (a) a gas inlet; (b) an outer electrode having a generally concave inner surface and comprising: (i) an ion inlet operable to receive the ions from the ion source and a carrier gas from the gas inlet; and (ii) an ion outlet; and (c) an inner electrode having a conduit therethrough and having a generally convex outer surface that is disposed in a spaced-apart and facing arrangement relative to the inner surface of the outer electrode for defining an ion separation region therebetween; and a mass analyzer for mass analyzing ions transmitted by the FAIMS cell through the ion outlet, wherein the inner electrode is moveable between a first position and a second position, the first position facilitating movement of the ions through the ion separation region, the second position facilitating movement of the ions through the conduit.Type: GrantFiled: April 16, 2010Date of Patent: April 17, 2012Assignee: Thermo Finnigan LLCInventors: Michael W. Belford, Jean-Jacques Dunyach, Mark E. Hardman
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Publication number: 20110253890Abstract: A system for analyzing ions comprises: an ion source; a FAIMS cell comprising: (a) a gas inlet; (b) an outer electrode having a generally concave inner surface and comprising: (i) an ion inlet operable to receive the ions from the ion source and a carrier gas from the gas inlet; and (ii) an ion outlet; and (c) an inner electrode having a conduit therethrough and having a generally convex outer surface that is disposed in a spaced-apart and facing arrangement relative to the inner surface of the outer electrode for defining an ion separation region therebetween; and a mass analyzer for mass analyzing ions transmitted by the FAIMS cell through the ion outlet, wherein the inner electrode is moveable between a first position and a second position, the first position facilitating movement of the ions through the ion separation region, the second position facilitating movement of the ions through the conduit.Type: ApplicationFiled: April 16, 2010Publication date: October 20, 2011Inventors: Michael W. BELFORD, Jean-Jacques Dunyach, Mark E. Hardman
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Patent number: 7425699Abstract: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are trapped in a potential well in the linear trap 30 and are bunched at the bottom of the potential well adjacent an exit segment 50. Ions are gated out of the linear trap 30 into an electrostatic ion trap 130 and are detected by a secondary electron multiplier 10. By bunching the ions in the linear trap 30 prior to ejection, and by focussing the ions in time of flight (TOF) upon the entrance of the electrostatic trap 130, the ions arrive at the electrostatic trap 130 as a convolution of short, energetic packets of similar m/z. Such packets are particularly suited to an electrostatic trap because the FWHM of each packet's TOF distribution is less than the period of oscillation of those ions in the electrostatic trap.Type: GrantFiled: August 1, 2007Date of Patent: September 16, 2008Assignee: Thermo Finnigan LLCInventors: Alexander Makarov, Mark E Hardman, Jae C. Schwartz, Michael W. Senko
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Patent number: 7265344Abstract: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are trapped in a potential well in the linear trap 30 and are bunched at the bottom of the potential well adjacent an exit segment 50. Ions are gated out of the linear trap 30 into an electrostatic ion trap 130 and are detected by a secondary electron multiplier 10. By bunching the ions in the linear trap 30 prior to ejection, and by focussing the ions in time of flight (TOF) upon the entrance of the electrostatic trap 130, the ions arrive at the electrostatic trap 130 as a convolution of short, energetic packets of similar m/z. Such packets are particularly suited to an electrostatic trap because the FWHM of each packet's TOF distribution is less than the period of oscillation of those ions in the electrostatic trap.Type: GrantFiled: February 13, 2006Date of Patent: September 4, 2007Assignee: Thermo Finnigan LLCInventors: Alexander Makarov, Mark E Hardman, Jae C. Schwartz, Michael W. Senko
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Patent number: 7109475Abstract: Disclosed are a time-of-flight mass spectrometer and signal processing electronics. The signal processing electronics include a plurality of time-to-digital converters configured to receive signal pulses from the same detector anode within the time-of-flight mass spectrometer. The signal processing electronics are further configured to differentiate, and compensate for, those signal pulses caused by the detection of more than one ion. Differentiation and compensation are achieved by using the time-to-digital converters to detect the leading and trailing edges of a signal pulse. The time difference between the detection of the leading edge and detection of the trailing edge is indicative of whether or not the signal pulse was generated by the detection of more than one ion.Type: GrantFiled: April 28, 2005Date of Patent: September 19, 2006Assignee: Thermo Finnigan LLCInventors: Mark E. Hardman, Lee Earley, Adrian Land
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Patent number: 6998609Abstract: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are trapped in a potential well in the linear trap 30 and are bunched at the bottom of the potential well adjacent an exit segment 50. Ions are gated out of the linear trap 30 into an electrostatic ion trap 130 and are detected by a secondary electron multiplier 10. By bunching the ions in the linear trap 30 prior to ejection, and by focussing the ions in time of flight (TOF) upon the entrance of the electrostatic trap 130, the ions arrive at the electrostatic trap 130 as a convolution of short, energetic packets of similar m/z. Such packets are particularly suited to an electrostatic trap because the FWHM of each packet's TOF distribution is less than the period of oscillation of those ions in the electrostatic trap.Type: GrantFiled: December 13, 2004Date of Patent: February 14, 2006Assignee: Thermo Finnigan LLCInventors: Alexander Makarov, Mark E. Hardman
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Patent number: 6995364Abstract: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are trapped in a potential well in the linear trap 30 and are bunched at the bottom of the potential well adjacent an exit segment 50. Ions are gated out of the linear trap 30 into an electrostatic ion trap 130 and are detected by a secondary electron multiplier 10. By bunching the ions in the linear trap 30 prior to ejection, and by focussing the ions in time of flight (TOF) upon the entrance of the electrostatic trap 130, the ions arrive at the electrostatic trap 130 as a convolution of short, energetic packets of similar m/z. Such packets are particularly suited to an electrostatic trap because the FWHM of each packet's TOF distribution is less than the period of oscillation of those ions in the electrostatic trap.Type: GrantFiled: March 24, 2005Date of Patent: February 7, 2006Assignee: Thermo Finnigan LLCInventors: Alexander Makarov, Mark E Hardman, Jae C. Schwartz, Michael W. Senko
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Patent number: 6872938Abstract: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are trapped in a potential well in the linear trap 30 and are bunched at the bottom of the potential well adjacent an exit segment 50. Ions are gated out of the linear trap 30 into an electrostatic ion trap 130 and are detected by a secondary electron multiplier 10. By bunching the ions in the linear trap 30 prior to ejection, and by focussing the ions in time of flight (TOF) upon the entrance of the electrostatic trap 130, the ions arrive at the electrostatic trap 130 as a convolution of short, energetic packets of similar m/z. Such packets are particularly suited to an electrostatic trap because the FWHM of each packet's TOF distribution is less than the period of oscillation of those ions in the electrostatic trap.Type: GrantFiled: March 20, 2002Date of Patent: March 29, 2005Assignee: Thermo Finnigan LLCInventors: Alexander Makarov, Mark E. Hardman, Jae C. Schwartz, Michael W. Senko
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Publication number: 20040108450Abstract: A mass spectrometer 10 comprises an ion source 12 which generates nebulized ions which enter an ion cooler 20 via an ion source block 16. Ions within a window of m/z of interest are extracted via a quadrupole mass filter 24 and passed to a linear trap 30. Ions are trapped in a potential well in the linear trap 30 and are bunched at the bottom of the potential well adjacent an exit segment 50. Ions are gated out of the linear trap 30 into an electrostatic ion trap 130 and are detected by a secondary electron multiplier 10.Type: ApplicationFiled: September 23, 2003Publication date: June 10, 2004Inventors: Alexander Makarov, Mark E Hardman, Jae C. Schwartz, Michael W. Senko