Patents by Inventor Mark E. Secrest

Mark E. Secrest has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for locating an alignment feature of a crystalline body
    Publication number: 20040213376
    Abstract: The method and apparatus of the present invention permit indirect identification of a target plane, such as the plane identified by an alignment feature, based upon the identification of a reference plane which is offset by a predetermined angle from the target plane. In addition, in order to permit alignment features to be defined at non-standard angles with respect to the axial orientation of an ingot, an apparatus is provided that includes a frame having at least two members. The first member abuts a bar extending outwardly from the stage of an x-ray diffractometer, while the second member carries an engagement member for engaging a non-standard alignment feature. The second member may be movable relative to the first member to permit the frame to be mounted upon ingots having different non-standard alignment features.
    Type: Application
    Filed: May 17, 2004
    Publication date: October 28, 2004
    Applicant: SEH America, Inc.
    Inventors: Richard M. Aydelott, Mark E. Secrest
  • Method and apparatus for orienting a crystalline body during radiation diffractometry
    Patent number: 6760403
    Abstract: The method and apparatus of the present invention permit indirect identification of a target plane, such as the plane identified by an alignment feature, based upon the identification of a reference plane which is offset by a predetermined angle from the target plane. In addition, in order to permit alignment features to be defined at non-standard angles with respect to the axial orientation of an ingot, an apparatus is provided that includes a frame having at least two members. The first member abuts a bar extending outwardly from the stage of an x-ray diffractometer, while the second member carries an engagement member for engaging a non-standard alignment feature. The second member may be movable relative to the first member to permit the frame to be mounted upon ingots having different non-standard alignment features.
    Type: Grant
    Filed: October 25, 2001
    Date of Patent: July 6, 2004
    Assignee: SEH America, Inc.
    Inventors: Richard M. Aydelott, Mark E. Secrest
  • Method and apparatus for orienting a crystalline body during radiation diffractometry
    Publication number: 20030081723
    Abstract: The method and apparatus of the present invention permit indirect identification of a target plane, such as the plane identified by an alignment feature, based upon the identification of a reference plane which is offset by a predetermined angle from the target plane. In addition, in order to permit alignment features to be defined at non-standard angles with respect to the axial orientation of an ingot, an apparatus is provided that includes a frame having at least two members. The first member abuts a bar extending outwardly from the stage of an x-ray diffractometer, while the second member carries an engagement member for engaging a non-standard alignment feature. The second member may be movable relative to the first member to permit the frame to be mounted upon ingots having different non-standard alignment features.
    Type: Application
    Filed: October 25, 2001
    Publication date: May 1, 2003
    Applicant: SEH America, Inc
    Inventors: Richard M. Aydelott, Mark E. Secrest