Patents by Inventor Mark Elston

Mark Elston has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10701571
    Abstract: In one embodiment, a test system comprises: a network access point simulation component, a local control component, and a reference component. The network access point simulation component is configured to simulate communication network access point operations comprising test interactions with user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated are variable. The local control component is configured to direct the network access point simulation component and to control the test interactions with the user equipment. The local control component comprises a test executive operable to direct simulation of communication network operations and the test interactions in accordance with information received from the remote control components. The reference component is operable to communicatively couple with the network access point simulation component similar to the user equipment and validate the test interactions.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: June 30, 2020
    Assignee: W2BI, INC.
    Inventors: Dinesh Doshi, Mark Elston, Vipul Jain, Amit Kucheriya, Derek Diperna, Liqun Liu, Ira Leventhal
  • Patent number: 10681570
    Abstract: In one embodiment, a test system comprises a first interface for communicating with remote devices; a second interface for communicating with local devices; a memory for storing information, including information received from the first interface and second interface; a processor for automatically configuring test system components in accordance with the information stored in the memory. The test system components comprise a network access point simulation component and a local control component. The network access point simulation component is configured to simulate communication network access point operations comprising test interactions with user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated can be variable. The local control component is configured to direct the network access point simulation component and to control the test interactions with the user equipment.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: June 9, 2020
    Assignee: W2BI, INC.
    Inventors: Dinesh Doshi, Mark Elston, Vipul Jain, Derek Diperna, Amit Kucheriya, Liqun Liu, Ira Leventhal
  • Patent number: 10548033
    Abstract: In one embodiment, a test system comprises: a network access point simulation component configured to simulate network access point operations and to simulate test interactions with user equipment, and a local control component configured to direct the network access point simulation component and to control test interactions with the user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated are variable. In one exemplary implementation, the local control component comprises a test executive operable to direct simulation of communication network operations and the test interactions in accordance with information received from the remote control components. The network access point simulation component and local control component are portable.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: January 28, 2020
    Assignee: w2bi, Inc.
    Inventors: Dinesh Doshi, Mark Elston, Amit Kucheriya, Derek Diperna, Vipul Jain, Liqun Liu, Ira Leventhal
  • Patent number: 10251079
    Abstract: Cloud-based management of cell-based test systems is described. For example, at a server that is communicatively coupled to a cell-based test system via a network (that is, in the cloud), a test case from a test case library is selected and accessed. The test case is selected according to the type of user equipment to be tested at the cell-based test system. The test case is sent from the server over the network to the cell-based test system. The cell-based test system can automatically perform the test case on the user equipment. Results from performing the test case on the user equipment are then stored on the cloud; that is, the test results are received at the server from the cell-based test system over the network and stored at the server. A report based on the test results can be prepared and stored on the server (in the cloud).
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: April 2, 2019
    Assignee: W2BI, INC.
    Inventors: Dinesh Doshi, Amit Kucheriya, Liqun Liu, Vipul Jain, Derek Diperna, Mark Elston, Ira Leventhal
  • Patent number: 10158552
    Abstract: To test user equipment at a cell-based test system, a type of user equipment to be tested is determined. A device profile for the type of the user equipment to be tested is accessed. The device profile includes, for example, a test script that can be used to control the user equipment during the testing. A test of the user equipment is performed at the cell-based test system. During the test, the user equipment is controlled according to the device profile in response to the software executing on a computer system.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: December 18, 2018
    Assignee: W2BI, INC.
    Inventors: Dinesh Doshi, Mark Elston, Derek Diperna, Vipul Jain, Liqun Liu, Amit Kucheriya, Ira Leventhal
  • Publication number: 20180049051
    Abstract: In one embodiment, a test system comprises a first interface for communicating with remote devices; a second interface for communicating with local devices; a memory for storing information, including information received from the first interface and second interface; a processor for automatically configuring test system components in accordance with the information stored in the memory. The test system components comprise a network access point simulation component and a local control component. The network access point simulation component is configured to simulate communication network access point operations comprising test interactions with user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated can be variable. The local control component is configured to direct the network access point simulation component and to control the test interactions with the user equipment.
    Type: Application
    Filed: August 12, 2016
    Publication date: February 15, 2018
    Inventors: Dinesh Doshi, Mark Elston, Vipul Jain, Derek Diperna, Amit Kucheriya, Liqun Liu, Ira Leventhal
  • Publication number: 20180049052
    Abstract: In one embodiment, a test system comprises: a network access point simulation component configured to simulate network access point operations and to simulate test interactions with user equipment, and a local control component configured to direct the network access point simulation component and to control test interactions with the user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated are variable. In one exemplary implementation, the local control component comprises a test executive operable to direct simulation of communication network operations and the test interactions in accordance with information received from the remote control components. The network access point simulation component and local control component are portable.
    Type: Application
    Filed: August 12, 2016
    Publication date: February 15, 2018
    Inventors: Dinesh Doshi, Mark Elston, Amit Kucheriya, Derek Diperna, Vipul Jain, Liqun Liu, Ira Leventhal
  • Publication number: 20180049050
    Abstract: In one embodiment, a test system comprises: a network access point simulation component, a local control component, and a reference component. The network access point simulation component is configured to simulate communication network access point operations comprising test interactions with user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated are variable. The local control component is configured to direct the network access point simulation component and to control the test interactions with the user equipment. The local control component comprises a test executive operable to direct simulation of communication network operations and the test interactions in accordance with information received from the remote control components. The reference component is operable to communicatively couple with the network access point simulation component similar to the user equipment and validate the test interactions.
    Type: Application
    Filed: August 12, 2016
    Publication date: February 15, 2018
    Inventors: Dinesh Doshi, Mark Elston, Vipul Jain, Amit Kucheriya, Derek Diperna, Liqun Liu, Ira Leventhal
  • Publication number: 20180049054
    Abstract: Cloud-based management of cell-based test systems is described. For example, at a server that is communicatively coupled to a cell-based test system via a network (that is, in the cloud), a test case from a test case library is selected and accessed. The test case is selected according to the type of user equipment to be tested at the cell-based test system. The test case is sent from the server over the network to the cell-based test system. The cell-based test system can automatically perform the test case on the user equipment. Results from performing the test case on the user equipment are then stored on the cloud; that is, the test results are received at the server from the cell-based test system over the network and stored at the server. A report based on the test results can be prepared and stored on the server (in the cloud).
    Type: Application
    Filed: August 12, 2016
    Publication date: February 15, 2018
    Inventors: Dinesh Doshi, Amit Kucheriya, Liqun Liu, Vipul Jain, Derek Diperna, Mark Elston, Ira Leventhal
  • Publication number: 20180048555
    Abstract: To test user equipment at a cell-based test system, a type of user equipment to be tested is determined. A device profile for the type of the user equipment to be tested is accessed. The device profile includes, for example, a test script that can be used to control the user equipment during the testing. A test of the user equipment is performed at the cell-based test system. During the test, the user equipment is controlled according to the device profile in response to the software executing on a computer system.
    Type: Application
    Filed: August 12, 2016
    Publication date: February 15, 2018
    Inventors: Dinesh Doshi, Mark Elston, Derek Diperna, Vipul Jain, Liqun Liu, Amit Kucheriya, Ira Leventhal
  • Patent number: 9785526
    Abstract: A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining information concerning a test class using a graphical user interface. Further, it comprises generating a first header file automatically, wherein the first header file comprises the information concerning the test class. Next, it comprises importing the first header file into a test plan operable to execute using a tester operating system wherein the test plan comprises instances of the test class. It further comprises, generating a second header file from the first header file automatically, wherein the second header file is a header file for the test class. The method also comprises validating the test plan using the tester operating system. Finally, the method comprises loading the test plan and a compiled module onto the tester operating system for execution, wherein the compiled module is a compiled translation of the test class.
    Type: Grant
    Filed: April 30, 2013
    Date of Patent: October 10, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Ankan Pramanick, Leon Chen, Chandra Pinjala
  • Patent number: 9785542
    Abstract: A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invoked within the test plan. The method subsequently comprises suspending execution of the test plan and unloading the modified test procedure. It also comprises compiling the modified test procedure to produce a compiled file and then reloading the test procedure into the test plan using the compiled file. Finally, it comprises resuming execution of the modified test procedure in a second debugging session and breaking the execution during the second debugging session at a breakpoint corresponding to the breakpoint entry location.
    Type: Grant
    Filed: April 16, 2013
    Date of Patent: October 10, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Leon Chen, Harsanjeet Singh, Hironori Maeda, Ankan Pramanick, Youbi Katsu
  • Patent number: 9274911
    Abstract: A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: March 1, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Harsanjeet Singh, Ankan Pramanick, Leon Lee Chen, Hironori Maeda, Chandra Pinjala, Ramachandran Krishnaswamy
  • Publication number: 20140324378
    Abstract: A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining information concerning a test class using a graphical user interface. Further, it comprises generating a first header file automatically, wherein the first header file comprises the information concerning the test class. Next, it comprises importing the first header file into a test plan operable to execute using a tester operating system wherein the test plan comprises instances of the test class. It further comprises, generating a second header file from the first header file automatically, wherein the second header file is a header file for the test class. The method also comprises validating the test plan using the tester operating system. Finally, the method comprises loading the test plan and a compiled module onto the tester operating system for execution, wherein the compiled module is a compiled translation of the test class.
    Type: Application
    Filed: April 30, 2013
    Publication date: October 30, 2014
    Applicant: Advantest Corporation
    Inventors: Mark ELSTON, Ankan PRAMANICK, Leon CHEN, Chandra PINJALA
  • Publication number: 20140310693
    Abstract: A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invoked within the test plan. The method subsequently comprises suspending execution of the test plan and unloading the modified test procedure. It also comprises compiling the modified test procedure to produce a compiled file and then reloading the test procedure into the test plan using the compiled file. Finally, it comprises resuming execution of the modified test procedure in a second debugging session and breaking the execution during the second debugging session at a breakpoint corresponding to the breakpoint entry location.
    Type: Application
    Filed: April 16, 2013
    Publication date: October 16, 2014
    Applicant: Advantest Corporation
    Inventors: Mark ELSTON, Leon CHEN, Harsanjeet SINGH, Hironori MAEDA, Ankan PRAMANICK, Youbi KATSU
  • Publication number: 20140237291
    Abstract: A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.
    Type: Application
    Filed: February 21, 2013
    Publication date: August 21, 2014
    Applicant: ADVANTEST CORPORATION
    Inventors: Mark Elston, Harsanjeet Singh, Ankan Pramanick, Leon Lee Chen, Hironori Maeda, Chandra Pinjala, Ramachandran Krishnaswamy
  • Patent number: 8255198
    Abstract: Test program development for a semiconductor test system, such as automated test equipment (ATE), using object-oriented constructs is described. The invention provides a method for describing test system resources, test system configuration, module configuration, test sequence, test plan, test condition, test pattern, and timing information in general-purpose object-oriented constructs, e.g., C++ objects and classes. In particular, the modularity of program development is suitable for developing test programs for an open architecture semiconductor test system.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: August 28, 2012
    Assignee: Advantest Corporation
    Inventors: Ramachandran Krishnaswamy, Harsanjeet Singh, Ankan Pramanick, Mark Elston, Leon Chen, Toshiaki Adachi, Yoshihumi Tahara
  • Patent number: 8214800
    Abstract: Method and system for associating software components with vendor hardware module versions in an open architecture test system are disclosed. The method includes receiving a set of hardware versions of a vendor hardware module, receiving a set of software components supported by the vendor hardware module, processing the set of hardware versions, where the set of hardware versions is represented as an equivalence class of hardware version numbers using a mask value, obtaining user choices of hardware versions of the vendor hardware module, validating the user choices of hardware versions of the vendor hardware module, and creating a system profile in accordance with the user choices of hardware versions.
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: July 3, 2012
    Assignee: Advantest Corporation
    Inventors: Ankan Pramanick, Mark Elston, Toshiaki Adachi
  • Patent number: 8082541
    Abstract: A method for managing multiple hardware test module versions, software components, and tester operating system (TOS) versions in a modular test system is disclosed. The method includes installing the TOS versions compatible with the modular test system in an archive and installing vendor software components corresponding to the hardware test module versions in the archive. The method further includes creating system profiles for describing vendor software components corresponding to the hardware test module versions and the TOS versions, selecting a system profile for the modular test system, where the system profile includes a set of compatible vendor software components and a selected TOS for testing a particular hardware test module version, and activating the selected TOS on the modular test system.
    Type: Grant
    Filed: April 5, 2005
    Date of Patent: December 20, 2011
    Assignee: Advantest Corporation
    Inventors: Ankan Pramanick, Jim Hanrahan, Mark Elston, Toshiaki Adachi, Leon L. Chen
  • Publication number: 20100192135
    Abstract: Test program development for a semiconductor test system, such as automated test equipment (ATE), using object-oriented constructs is described. The invention provides a method for describing test system resources, test system configuration, module configuration, test sequence, test plan, test condition, test pattern, and timing information in general-purpose object-oriented constructs, e.g., C++ objects and classes. In particular, the modularity of program development is suitable for developing test programs for an open architecture semiconductor test system.
    Type: Application
    Filed: March 26, 2010
    Publication date: July 29, 2010
    Applicant: Advantest Corporation
    Inventors: Ramachandran KRISHNASWAMY, Harsanjeet SINGH, Ankan PRAMANICK, Mark ELSTON, Leon CHEN, Toshiaki ADACHI, Yoshihumi TAHARA