Patents by Inventor Mark G. Dowsett

Mark G. Dowsett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Combined magnetic sector mass spectrometer and time-of-flight mass spectrometer
    Patent number: 5171987
    Abstract: A mass spectrometry system includes a double-focusing magnetic sector mass spectrometer and a time-of-flight spectrometer arranged in parallel. The spectrometers share a common means for exciting ions from a sample, and a common transfer optics system. An interleaved control system for the two spectrometers, is arranged also to control a sampling handling arrangement dependent on the output of the time-of-flight spectrometer, so as to enable the double-focusing magnetic sector mass spectrometer to analyze a region of interest on a sample.
    Type: Grant
    Filed: March 19, 1991
    Date of Patent: December 15, 1992
    Assignee: Kratos Analytical Ltd.
    Inventors: John D. Waldron, Mark G. Dowsett, Peter J. Derrick
  • Charged particle extraction arrangement
    Patent number: 5164594
    Abstract: An arrangement is described for extracting charged particles which have been emitted from a sample due to the impact of a primary ion beam. The arrangement comprises an electrode arrangement effective to produce an electric potential which is non-linear along a chosen direction of travel of the particles. A system of einzel lenses is effective to match the trajectories of the particles passing from the electrode means to the analyser of a mass spectrometer.
    Type: Grant
    Filed: October 22, 1991
    Date of Patent: November 17, 1992
    Assignee: Kratos Analytical, Limited
    Inventors: Stephen P. Thompson, Mark G. Dowsett