Abstract: A novel photomechanical positioning method using optic fibers, and apparatuses that employ the method, is described. The method comprises providing an optic fiber that changes length in response to the transmission of a light beam through the fiber. The optic fiber may be attached to an object capable of movement in response to a change in the fiber's length. An illustrated embodiment of an apparatus employing such method is an interferometer that includes an optic fiber made from a polymeric organic material. A movable mirror forms one arm of the interferometer, and is attached to the optic fiber for movement in response to changes in the length of the fiber. A light source, such as a laser, generates a beam of light that is transmitted through the optic fiber. The system also generally includes a feedback path for transmitting a portion of the light beam into the end of the fiber opposite the end of the fiber to which the object is attached.

Abstract: A novel photomechanical positioning method using optic fibers, and one embodiment of an apparatus that employs the method, is described. The method comprises providing an optic fiber that changes length in response to the transmission of a light beam through the fiber. The optic fiber is attached to an object capable of movement in response to a change in the fiber's length. An illustrated embodiment of an apparatus employing such method is an interferometer that includes an optic fiber made from a polymeric organic material. A movable mirror forms one arm of the interferometer, and is attached to the optic fiber for movement in response to changes in the length of the fiber. A light source, such as a laser, is used to generate a beam of light that is transmitted through the optic fiber. The system also generally includes a feedback path for transmitting a portion of the light beam into the end of the fiber opposite the end of the fiber to which the object is attached.

Abstract: An integrated circuit device (11) is tested by directing a laser beam (19) onto an electrochromic member (17) in close proximity to a conductor (13) of the integrated circuit. Reflected laser light is directed to a detector (21) which converts it to an electrical signal for display by a lock-in amplifier (25). The display characterizes the voltage on the conductor (17) and thereby permits diagnosis of the operation of the integrated circuit (11).