Abstract: An emission test system may include at least one controller configured to determine, directly or indirectly, a quantity of diluted exhaust sample in a container at the completion of an emissions test, and to cause additional diluent gas to be added to the container based on the determined quantity.

Abstract: An emission test system may include at least one controller configured to determine, directly or indirectly, a quantity of diluted exhaust sample in a container at the completion of an emissions test, and to cause additional diluent gas to be added to the container based on the determined quantity.

Abstract: An emission test system may include at least one controller configured to determine, directly or indirectly, a quantity of diluted exhaust sample in a container at the completion of an emissions test, and to cause additional diluent gas to be added to the container based on the determined quantity.

Abstract: For a jitter measurement product histograms, trends and spectrums of random and deterministic jitter components are provided on a jitter component basis rather than just on overall jitter. At each stage of the jitter separation histograms, time trends (measurement vs. time), cycle trends (measurement vs. cycle or UI) or spectrums may be provided. Additionally the spectrum for a periodic jitter component may be further separated into sub-spectrums representing correlated sub-sets of the periodic jitter component. Conversion of each sub-spectrum into the time domain provides a characteristic signal that may identify one source of the periodic jitter. From the various plots the contribution of a particular jitter component or a particular combination of jitter components to an eye opening and system performance may be obtained.