Abstract: A shower/commode wheeled chair adapted to be locatable over a commode, the shower/commode wheeled chair comprising a frame, a seat support portion, a front portion extending downwardly from the seat support portion, a back support, a shower/commode seat, wheels and a footrest coupled to the front portion.

Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.

Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.

Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.

Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.

Abstract: An improved circuit and method for detecting dielectric breakdown and ground fault conditions is provided. The circuitry and method of the present invention include taking a continuous voltage reading of the high voltage battery and sampling the continuous voltage reading of the high voltage battery at a fixed time interval. The circuitry and method calculate a change in the continuous voltage reading of the high voltage battery over the change in time and repeatedly calculate an optimum fixed time interval and an optimum change in voltage over time. Storage of the optimum fixed time interval and optimum change in voltage over time provides for repeatedly comparing the optimum change in voltage over the fixed time interval to the constant voltage of the high voltage battery to calculate the resistance of the dielectric breakdown fault. The calculation of the resistance of the dielectric breakdown fault is carried out independently of the capacitance of the electric circuit.

Abstract: An improved circuit and method for detecting dielectric breakdown and ground fault conditions is provided. The circuitry and method of the present invention include taking a continuous voltage reading of the high voltage battery and sampling the continuous voltage reading of the high voltage battery at a fixed time interval. The circuitry and method calculate a change in the continuous voltage reading of the high voltage battery over the change in time and repeatedly calculate an optimum fixed time interval and an optimum change in voltage over time. Storage of the optimum fixed time interval and optimum change in voltage over time provides for repeatedly comparing the optimum change in voltage over the fixed time interval to the constant voltage of the high voltage battery to calculate the resistance of the dielectric breakdown fault. The calculation of the resistance of the dielectric breakdown fault is carried out independently of the capacitance of the electric circuit.