Patents by Inventor Mark H. Werlich

Mark H. Werlich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5750988
    Abstract: A method apparatus wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The method and apparatus provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.
    Type: Grant
    Filed: February 3, 1997
    Date of Patent: May 12, 1998
    Assignee: Hewlett-Packard Company
    Inventors: James A. Apffel, Mark H. Werlich, James L. Bertsch, Paul C. Goodley
  • Patent number: 5703360
    Abstract: An automated calibrant system is provided for use in a liquid separation/mass spectrometry (LS/MS) apparatus. The calibrant system is pneumatically pressurized to forcibly move a reference liquid from the calibrant system to an ion source. The ion source is in fluid communication with a switching valve and with a mass spectrometer. The switching valve communicates effluent from a liquid separation system to the source when the switching valve is in a first position, and communicates one or more reference liquids from the calibrant system to the source when the switching valve is in a second position. The switching valve, and liquid handling valves in the calibrant system, can be individually activated manually or by automated means to alternate between analytical and calibration modes of operation in the LS/MS apparatus. A method is also provided for calibrating a mass spectrometer in a LS/MS apparatus during processing of a liquid sample by the liquid separation system.
    Type: Grant
    Filed: August 30, 1996
    Date of Patent: December 30, 1997
    Assignee: Hewlett-Packard Company
    Inventors: Steven M. Fischer, Robert G. Nordman, Mark H. Werlich
  • Patent number: 5495108
    Abstract: The invention teaches the uses of a plurality of electric fields and of orthogonal spray configurations of vaporized analyte which combine so as to operate to enhance the efficiency of analyte detection and mass analysis with a mass spectrometer by reducing vapor in the vacuum system and concomitant noise. Several embodiments of the invention are described for purposes of illustration.
    Type: Grant
    Filed: July 11, 1994
    Date of Patent: February 27, 1996
    Assignee: Hewlett-Packard Company
    Inventors: James A. Apffel, Jr., Mark H. Werlich, James L. Bertsch
  • Patent number: RE36892
    Abstract: .[.The invention teaches the uses of a plurality of electric fields and of orthogonal spray configurations of vaporized analyte which combine so as to operate to enhance the efficiency of analyte detection and mass analysis with a mass spectrometer by reducing vapor in the vacuum system and concomitant noise. Several embodiments of the invention are described for purposes of illustration..]. .Iadd.The invention relates to a method and apparatus for improving signal relative to noise without loss of ion collection efficiency in electrospray mass spectrometry, including liquid chromatography/mass spectrometry..Iaddend.
    Type: Grant
    Filed: January 31, 1997
    Date of Patent: October 3, 2000
    Assignee: Agilent Technologies
    Inventors: James A. Apffel, Jr., Mark H. Werlich, James L. Bertsch, Paul C. Goodley, Kent D. Henry