Patents by Inventor Mark Hail

Mark Hail has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ANALYSIS OF DATA FROM A MASS SPECTROMETER
    Publication number: 20070090285
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Application
    Filed: December 6, 2006
    Publication date: April 26, 2007
    Applicant: NOVATIA, LLC
    Inventors: Jeffrey Whitney, David Detlefsen, Mark Hail
  • ANALYSIS OF DATA FROM A MASS SPECTROMETER
    Publication number: 20060219894
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Application
    Filed: March 21, 2006
    Publication date: October 5, 2006
    Applicant: Novatia, LLC
    Inventors: Jeffrey Whitney, David Detlefsen, Mark Hail
  • Analysis of data from a mass spectrometer
    Publication number: 20050006576
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Application
    Filed: May 28, 2004
    Publication date: January 13, 2005
    Inventors: Jeffrey Whitney, David Detlefsen, Mark Hail