Abstract: System and method for a multisite, integrated combination probe card and spider card. A preferred embodiment comprises a series of signal pins configured to mate with test equipment, a socket region coupled to a plurality of integrated circuits, and an open electrical connections block coupled to the series of signal pins and the socket region. If the combination card is to be used as a probe card, then the open electrical connections block is configured to decouple the series of electrical pins from the socket region and a hole is made in the socket region to hold a probe header. If the combination card is to be used as a spider card, then the open electrical connections block is configured to couple the series of electrical pins with the socket region and sockets for holding packaged integrated circuits are added to the socket region.