Patents by Inventor Mark J. Cola

Mark J. Cola has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11260454
    Abstract: A system and a corresponding method of correcting temperature data from a non-imaging optical sensor involve collecting temperature data generated using the optical sensor. The temperature data describes temperature changes across a surface of a material during an additive manufacturing operation in which the material is heated by a heat source. The method includes estimating a size of a hot spot corresponding to a hottest region formed on the surface by the heat source; and estimating a size of a heated region corresponding to a locus of points within the field of view that contribute to the temperature data. The method further includes correcting the temperature data based on the estimated sizes of the hot spot and the heated region.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: March 1, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola
  • Publication number: 20220001497
    Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.
    Type: Application
    Filed: July 14, 2021
    Publication date: January 6, 2022
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola
  • Publication number: 20210404886
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: July 9, 2021
    Publication date: December 30, 2021
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20210379666
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: August 23, 2021
    Publication date: December 9, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11135654
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: May 18, 2018
    Date of Patent: October 5, 2021
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11073431
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: July 27, 2021
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 11072043
    Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.
    Type: Grant
    Filed: March 21, 2017
    Date of Patent: July 27, 2021
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola
  • Publication number: 20210060647
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Application
    Filed: August 7, 2020
    Publication date: March 4, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20210046546
    Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
    Type: Application
    Filed: August 26, 2020
    Publication date: February 18, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Mark J. Cola, Scott Betts, Darren Beckett, Alberto M. Castro, Lars Jacquemetton, Martin Piltch
  • Publication number: 20200398550
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Application
    Filed: June 29, 2020
    Publication date: December 24, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Patent number: 10786850
    Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: September 29, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Mark J. Cola, Scott Betts, Darren Beckett, Alberto M. Castro, Lars Jacquemetton, Martin Piltch
  • Patent number: 10786948
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: September 29, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20200290154
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: March 26, 2020
    Publication date: September 17, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20200249099
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: November 8, 2019
    Publication date: August 6, 2020
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 10717264
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: July 21, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Patent number: 10639745
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: May 5, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20200101671
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: September 18, 2019
    Publication date: April 2, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Patent number: 10520372
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: December 31, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 10479020
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: November 19, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Publication number: 20190323903
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: June 7, 2019
    Publication date: October 24, 2019
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro