Patents by Inventor Mark J. ERDMANN

Mark J. ERDMANN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Precision surface measurement in a vacuum
    Patent number: 10151574
    Abstract: Methods and related equipment for dynamic on-axis in-situ interferometry where the reference surface is positioned in an vacuum chamber. The systems use a wavelength shifting, or a phase shifting interferometer that allows the freedom to eliminate the need to step the cavity length physically with the reference surface, allowing the reference surface to be placed inside the vacuum chamber.
    Type: Grant
    Filed: July 12, 2017
    Date of Patent: December 11, 2018
    Assignee: UChicago Argonne, LLC
    Inventors: Raymond P. Conley, Jun Qian, Mark J. Erdmann, Elina Kasman, Lahsen Assoufid, Scott J. Izzo
  • PRECISION SURFACE MEASUREMENT IN A VACUUM
    Publication number: 20180017372
    Abstract: Methods and related equipment for dynamic on-axis in-situ interferometry where the reference surface is positioned in an vacuum chamber. The systems use a wavelength shifting, or a phase shifting interferometer that allows the freedom to eliminate the need to step the cavity length physically with the reference surface, allowing the reference surface to be placed inside the vacuum chamber.
    Type: Application
    Filed: July 12, 2017
    Publication date: January 18, 2018
    Inventors: Raymond P. CONLEY, Jun QIAN, Mark J. ERDMANN, Elina KASMAN, Lahsen ASSOUFID, Scott J. IZZO