Abstract: An integrated circuit package comprises a set of bond fingers for connecting wire bonds from the chip, the bond fingers being placed overlapping on a transverse axis from the chip and extending inwardly and outwardly from vias positioned at different positions along the transverse axis, so that wire bonds connected to adjacent fingers have the same length.

Abstract: A method for reducing the number of wire-bond loop heights which are required in comparison with a total quantity of power and signal rings employed in low profile wire-bond integrated circuit packages. There are also provided low profile wire-bond packages which are produced in accordance with the method pursuant to the invention.

Abstract: A plating tail connected to a signal trace for use during an electroplating operation is fabricated such that it has a substantially different impedance from the signal trace at a characteristic frequency in use, so that adverse reflections during operation are reduced below a threshold of significance.

Abstract: A plating tail connected to a signal trace for use during an electroplating operation is fabricated such that it has a substantially different impedance from the signal trace at a characteristic frequency in use, so that adverse reflections during operation are reduced below a threshold of significance.

Abstract: A method for reducing the number of wire-bond loop heights which are required in comparison with a total quantity of power and signal rings employed in low profile wire-bond integrated circuit packages. There are also provided low profile wire-bond packages which are produced in accordance with the method pursuant to the invention.

Abstract: A plating tail connected to a signal trace for use during an electroplating operation is fabricated such that it has a substantially different impedance from the signal trace at a characteristic frequency in use, so that adverse reflections during operation are reduced below a threshold of significance.

Abstract: A method for reducing the number of wire-bond loop heights which are required in comparison with a total quantity of power and signal rings employed in low profile wire-bond integrated circuit packages. There are also provided low profile wire-bond packages which are produced in accordance with the method pursuant to the invention.

Abstract: A method for reducing the number of wire-bond loop heights which are required in comparison with a total quantity of power and signal rings employed in low profile wire-bond integrated circuit packages. There are also provided low profile wire-bond packages which are produced in accordance with the method pursuant to the invention.

Abstract: A method for reducing the number of wire-bond loop heights which are required in comparison with a total quantity of power and signal rings employed in low profile wire-bond integrated circuit packages. There are also provided low profile wire-bond packages which are produced in accordance with the method pursuant to the invention.

Abstract: A flex circuit, which is fabricated from metallization on thin film, is mounted between two opposite sides of frame to form an electronic card sized to fit as a replacement for a rigid epoxy glass card in a card carrier having a backplane. Appropriate placement of electrical components on the flex circuit and using a flex circuit longer than the spacing between the opposite sides of the frame to which the flex circuit is mounted, allows the use of taller parts on adjacent cards in the card carrier, since the flex circuit can be conformed to eliminate obstructions caused by insufficient spacing between cards.

Abstract: A shared power controller for a rack of interface devices which are shared among a plurality of processor units. The shared power controller may be commanded into a power up mode by any connected central processor via its system power interface. A power down of a connected rack of interface units may, however, only be effected when all the connected CPU units enter a power down mode. A system power controller provides both remote and local operation such that diagnosis and analysis of problems may be effected locally at each rack of input/output devices.