Abstract: A socket for securing an integrated circuit (IC) during burn-in or test procedures. The socket includes a base which carries a plurality of electrically conductive contacts. Opposed hold down rollers are shiftably journaled in the base. The socket also includes a movable top connected to the base and a contact with the rollers. Movement of the top shifts the rollers between secured and open positions. A rotatable lever housed in the base is connected to an actuating arm which is also shiftable by movement of the top. The lever is operably associated with the contacts and shifts the contacts between an operative position in contact with the IC chip leads and a standby position spaced from the IC chip leads.

Abstract: A socket for securing an integrated circuit (IC) during burn-in or test procedures. The socket includes a base which carries a plurality of electrically conductive contacts. Opposed hold down latches are shiftably connected to the base and include outer cams. The socket also includes a movable top which has an integral nib for contacting the latch cams to effect shifting of the latches. A rotatable lever housed in the base is connected to an actuating arm which is shiftable by movement of the top. The lever is operably associated with the contacts and shifts the contacts between an operative position in contact with the IC leads and a standby position spaced from the leads.