Patents by Inventor Mark John Worsley

Mark John Worsley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9910001
    Abstract: A method and apparatus for detecting machined substrate fragments by thermography. A heat source applies heat to a surface of machined component, the surface providing access to one or more internal chambers within an interior space of the component. The application of heat is sufficient in temperature and duration to cause a fragment temperature elevation rate in at least one machined substrate fragment present in at least one internal chamber that is greater than temperature elevation rate of the component. An IR detection device operably connected to a visual output device captures the IR signal from the component surface following the application of heat and outputs a thermal image of the component. Heat elevation points within the thermal image correspond with the presence of machined substrate fragments within at least one internal chamber of the component.
    Type: Grant
    Filed: October 1, 2015
    Date of Patent: March 6, 2018
    Assignee: Radix Inc.
    Inventors: Nikola Dimitrov, Mark John Worsley, Ahmad Shawky
  • Publication number: 20170097312
    Abstract: A method and apparatus for detecting machined substrate fragments by thermography. A heat source applies heat to a surface of machined component, the surface providing access to one or more internal chambers within an interior space of the component. The application of heat is sufficient in temperature and duration to cause a fragment temperature elevation rate in at least one machined substrate fragment present in at least one internal chamber that is greater than temperature elevation rate of the component. An IR detection device operably connected to a visual output device captures the IR signal from the component surface following the application of heat and outputs a thermal image of the component. Heat elevation points within the thermal image correspond with the presence of machined substrate fragments within at least one internal chamber of the component.
    Type: Application
    Filed: October 1, 2015
    Publication date: April 6, 2017
    Applicant: RADIX, Inc.
    Inventors: Nikola Dimitrov, Mark John Worsley, Ahmad Shawky