Patents by Inventor Mark Kalei Hadrick

Mark Kalei Hadrick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11928039
    Abstract: Apparatuses and techniques for implementing a data-transfer test mode are described. The data-transfer test mode refers to a mode in which the transfer of data from an interface die to a linked die can be tested prior to connecting the interface die to the linked die. In particular, the data-transfer test mode enables the interface die to perform aspects of a write operation and output a portion of write data that is intended for the linked die. With the data-transfer test mode, testing (or debugging) of the interface die can be performed during an earlier stage in the manufacturing process before integrating the interface die into an interconnected die architecture. For example, this type of testing can be performed at a wafer level or at a single-die-package (SDP) level. In general, the data-transfer test mode can be executed independent of whether the interface die is connected to the linked die.
    Type: Grant
    Filed: November 1, 2022
    Date of Patent: March 12, 2024
    Assignee: Micron Technologies, Inc.
    Inventors: Yang Lu, Kang-Yong Kim, Mark Kalei Hadrick, Keun Soo Song
  • Publication number: 20240079036
    Abstract: Apparatuses and techniques for implementing a standalone mode are described. The standalone mode refers to a mode in which a die that is designed to operate as one of multiple dies that are interconnected can operate independently of another one of the multiple dies. Prior to connecting the die to the other die, the die can perform a standalone read operation and/or a standalone write operation in accordance with the standalone mode. In this way, testing (or debugging) can be performed during an earlier stage in the manufacturing process before integrating the die into an interconnected die architecture. For example, this type of testing can be performed at a wafer level or at a single-die-package (SDP) level. In general, the standalone mode can be executed independent of whether the die is connected to the other die.
    Type: Application
    Filed: September 6, 2022
    Publication date: March 7, 2024
    Applicant: Micron Technology, Inc.
    Inventors: Yang Lu, Mark Kalei Hadrick, Kang-Yong Kim
  • Publication number: 20230342047
    Abstract: Described apparatuses and methods relate to self-refresh arbitration. In a memory system with multiple memory components, an arbiter is configured to manage the occurrence of self-refresh operations. In aspects, the arbiter can receive one or more self-refresh request signals from at least one memory controller for authorization to command one or more memory components to enter a self-refresh mode. Upon receiving the one or more self-refresh request signals, the arbiter, based on a predetermined configuration, can transmit one or more self-refresh enable signals to the at least one memory controller with authorization to command the one or more memory components to enter the self-refresh mode. The configuration can ensure that fewer than all memory components simultaneously enter the self-refresh mode. In so doing, memory components can perform self-refresh operations without exceeding an instantaneous power threshold. The arbiter can be included in, for instance, a Compute Express Link™ (CXL™) memory module.
    Type: Application
    Filed: April 21, 2022
    Publication date: October 26, 2023
    Applicant: Micron Technology, Inc.
    Inventors: Mark Kalei Hadrick, Yu-Sheng Hsu, John Christopher Sancon, Kang-Yong Kim, Yang Lu
  • Publication number: 20230343380
    Abstract: Described apparatuses and methods relate to a bank-level self-refresh for a memory system. A memory device can include a controller with logic that implements self-refresh operations in the memory device. The logic may perform self-refresh operations on a set of banks of the memory device that is less than all banks within the memory device. The set of banks of the memory device may be determined such that the peak current in a power distribution network of the memory device is bounded when the self-refresh operation is performed. Accordingly, bank-level self-refresh can reduce a cost of the memory device of a memory system by enabling use of a less complicated power distribution network. The bank-level self-refresh may also be implemented with different types of refresh operations. Amongst other scenarios, bank-level self-refresh can be deployed in memory-expansion environments.
    Type: Application
    Filed: April 21, 2022
    Publication date: October 26, 2023
    Applicant: Micron Technology, Inc.
    Inventors: John Christopher Sancon, Yang Lu, Kang-Yong Kim, Mark Kalei Hadrick, Hyun Yoo Lee
  • Publication number: 20230342048
    Abstract: Described apparatuses and methods relate to self-refresh arbitration. In a memory system with multiple memory components, an arbiter is configured to manage the occurrence of self-refresh operations. In aspects, the arbiter can receive one or more self-refresh request signals from at least one memory controller for authorization to command one or more memory components to enter a self-refresh mode. Upon receiving the one or more self-refresh request signals, the arbiter, based on a predetermined configuration, can transmit one or more self-refresh enable signals to the at least one memory controller with authorization to command the one or more memory components to enter the self-refresh mode. The configuration can ensure that fewer than all memory components simultaneously enter the self-refresh mode. In so doing, memory components can perform self-refresh operations without exceeding an instantaneous power threshold. The arbiter can be included in, for instance, a Compute Express Link™ (CXL™) memory module.
    Type: Application
    Filed: April 21, 2022
    Publication date: October 26, 2023
    Applicant: Micron Technology, Inc.
    Inventors: Mark Kalei Hadrick, Yu-Sheng Hsu, John Christopher Sancon, Kang-Yong Kim, Yang Lu
  • Publication number: 20230343381
    Abstract: Described apparatuses and methods relate to a bank-level self-refresh for a memory system. A memory device can include logic that implements self-refresh operations in the memory device. The logic may perform self-refresh operations on a set of banks of the memory device that is less than all banks within the memory device. The set of banks of the memory device may be determined such that the peak current in a power distribution network of the memory device is bounded when the self-refresh operation is performed. Accordingly, bank-level self-refresh can reduce a cost of the memory device of a memory system by enabling use of a less complicated power distribution network. The bank-level self-refresh may also be implemented with different types of refresh operations. Amongst other scenarios, bank-level self-refresh can be deployed in memory-expansion environments.
    Type: Application
    Filed: April 21, 2022
    Publication date: October 26, 2023
    Applicant: Micron Technology, Inc.
    Inventors: John Christopher Sancon, Yang Lu, Kang-Yong Kim, Mark Kalei Hadrick, Hyun Yoo Lee