Patents by Inventor Mark L. Eickhoff

Mark L. Eickhoff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5218426
    Abstract: A highly accurate in-situ determination of the refractivity of an ambient atmosphere is disclosed, which determination is utilizable to enhance the accuracy of a quantity measurement. The system includes use of a refractometer exposed to an ambient atmosphere and having light directed thereto to form an optical interference fringe pattern having a dependence upon the refractivity of the ambient atmosphere. The fringe pattern is measured as a function of angle either by sequentially scanning a collimated input beam in angle while collecting and detecting the transmitted light, or by imaging (onto a multi-element detector) the angular exit space of the interferometer illuminated with a diverging input beam. The electrical output of the detector is processed to provide an output indicative of the index of refraction of the ambient atmosphere.
    Type: Grant
    Filed: July 1, 1991
    Date of Patent: June 8, 1993
    Assignee: The United States of America as represented by the Secretary of Commerce
    Inventors: John L. Hall, Peter J. Martin, Mark L. Eickhoff, Michael P. Winters