Patents by Inventor Mark L. Oelke

Mark L. Oelke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8396999
    Abstract: A system having input/output hot spot tracking is disclosed. The storage system includes a storage device, a host controller coupled to the storage device, and a tracking engine coupled to the host controller and the storage device. The host controller is configured to managed input/output of the storage device. The tracking engine includes a storage map cycling between active status and passive status. Input/output commands are stored in the storage map during the active status. Like input/output commands in the storage map during active status are counted and compared to a number. Counts greater than the number are reported as input/output hot spots.
    Type: Grant
    Filed: May 2, 2011
    Date of Patent: March 12, 2013
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Nhan Q. Vo, Benjamin T. Allen, Chiung-Sheng Wu, Stephen M. Schultz, Jay E. Allison, Jr., Mark L. Oelke
  • Publication number: 20120284433
    Abstract: A system having input/output hot spot tracking is disclosed. The storage system includes a storage device, a host controller coupled to the storage device, and a tracking engine coupled to the host controller and the storage device. The host controller is configured to managed input/output of the storage device. The tracking engine includes a storage map cycling between active status and passive status. Input/output commands are stored in the storage map during the active status. Like input/output commands in the storage map during active status are counted and compared to a number. Counts greater than the number are reported as input/output hot spots.
    Type: Application
    Filed: May 2, 2011
    Publication date: November 8, 2012
    Inventors: Nhan Q. Vo, Benjamin T. Allen, Chiung-Sheng Wu, Stephen M. Schultz, Jay E. Allison, JR., Mark L. Oelke