Patents by Inventor Mark M. Abbott

Mark M. Abbott has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7710558
    Abstract: An apparatus which measures a size and a shape of a transparent sheet includes a conveyor, a lighting apparatus, an imaging device and a process controller. The conveyor moves the transparent sheet. The lighting apparatus projects light onto the transparent sheet. The imaging device receives reflected light reflected from the transparent sheet. A thickness is input into the process controller. A sheet temperature from a sheet temperature sensor and/or a structure temperature from a structure temperature sensor are output to the process controller. An image is output from the imaging device to the process controller. The process controller outputs the size and the shape of the transparent sheet. The outputs from the process controller are used to adjust machine tools used to fabricate the transparent sheet.
    Type: Grant
    Filed: September 11, 2008
    Date of Patent: May 4, 2010
    Assignee: LiteSentry Corporation
    Inventors: Douglas Wornson, Eric L. Hegstrom, Mark M Abbott
  • Publication number: 20100060902
    Abstract: An apparatus which measures a size and a shape of a transparent sheet includes a conveyor, a lighting apparatus, an imaging device and a process controller. The conveyor moves the transparent sheet. The lighting apparatus projects light onto the transparent sheet. The imaging device receives reflected light reflected from the transparent sheet. A thickness is input into the process controller. A sheet temperature from a sheet temperature sensor and/or a structure temperature from a structure temperature sensor are output to the process controller. An image is output from the imaging device to the process controller. The process controller outputs the size and the shape of the transparent sheet. The outputs from the process controller are used to adjust machine tools used to fabricate the transparent sheet.
    Type: Application
    Filed: September 11, 2008
    Publication date: March 11, 2010
    Applicant: LITESENTRY CORPORATION
    Inventors: Douglas Wornson, Eric L. Hegstrom, Mark M. Abbott
  • Patent number: 7345698
    Abstract: A method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets are disclosed. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass and uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass and reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency and measures distortion in all axes.
    Type: Grant
    Filed: February 28, 2003
    Date of Patent: March 18, 2008
    Assignee: Litesentry Corporation
    Inventors: Mark M. Abbott, Eric Hegstrom
  • Publication number: 20040057046
    Abstract: The invention is related to a method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass. The inspection method uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass as it moves through the apparatus. The projected circles reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency. The method measures distortion in all axes.
    Type: Application
    Filed: February 28, 2003
    Publication date: March 25, 2004
    Inventors: Mark M. Abbott, Eric Hegstrom