Patents by Inventor Mark McCord
Mark McCord has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11994621Abstract: A scanning lidar system includes a first lens having a first lens center and characterized by a first optical axis and a first surface of best focus, a second lens having a second lens center and characterized by a second optical axis, a platform separated from the first lens and the second lens along the first optical axis, and an array of laser sources mounted on the platform. Each laser source of the array of laser sources has an emission surface lying substantially at the first surface of best focus of the first lens and positioned at a respective laser position. The scanning lidar system further includes an array of photodetectors mounted on the platform. Each photodetector of the array of photodetectors is positioned at a respective photodetector position that is optically conjugate with a respective laser position of a corresponding laser source.Type: GrantFiled: September 30, 2020Date of Patent: May 28, 2024Assignee: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Daryoosh Rejaly
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Publication number: 20210103039Abstract: A scanning lidar system includes a first lens having a first lens center and characterized by a first optical axis and a first surface of best focus, a second lens having a second lens center and characterized by a second optical axis, a platform separated from the first lens and the second lens along the first optical axis, and an array of laser sources mounted on the platform. Each laser source of the array of laser sources has an emission surface lying substantially at the first surface of best focus of the first lens and positioned at a respective laser position. The scanning lidar system further includes an array of photodetectors mounted on the platform. Each photodetector of the array of photodetectors is positioned at a respective photodetector position that is optically conjugate with a respective laser position of a corresponding laser source.Type: ApplicationFiled: September 30, 2020Publication date: April 8, 2021Applicant: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Daryoosh Rejaly
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Patent number: 10955530Abstract: A scanning lidar system includes an external frame, an internal frame attached to the external frame by vibration-isolation mounts, and an electro-optic assembly movably attached to the internal frame and configured to be translated with respect to the internal frame during scanning operation of the scanning lidar system.Type: GrantFiled: December 13, 2017Date of Patent: March 23, 2021Assignee: Cepton Technologies, Inc.Inventors: Jun Pei, Mark Mccord, Jun Ye, Yupeng Cui, Liqun Han
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Patent number: 10845466Abstract: A scanning lidar system includes a first lens having a first lens center and characterized by a first optical axis and a first surface of best focus, a second lens having a second lens center and characterized by a second optical axis, a platform separated from the first lens and the second lens along the first optical axis, and an array of laser sources mounted on the platform. Each laser source of the array of laser sources has an emission surface lying substantially at the first surface of best focus of the first lens and positioned at a respective laser position. The scanning lidar system further includes an array of photodetectors mounted on the platform. Each photodetector of the array of photodetectors is positioned at a respective photodetector position that is optically conjugate with a respective laser position of a corresponding laser source.Type: GrantFiled: December 13, 2017Date of Patent: November 24, 2020Assignee: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Daryoosh Rejaly
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Patent number: 10754036Abstract: A three-dimensional imaging system includes a first illumination source configured to project a first fan of light toward an object in a field of view, and a second illumination source configured to project a second fan of light substantially parallel to and spaced apart from the first fan of light. The first illumination source and the second illumination source are further configured to scan the first fan of light and the second fan of light synchronously laterally across the field of view. The three-dimensional imaging system further includes a camera configured to capture a plurality of image frames of the field of view as the first fan of light and the second fan of light are scanned over a plurality of regions the object, and a processor coupled to the camera and configured to construct a three-dimensional image of the object based on the plurality of image frames.Type: GrantFiled: December 22, 2016Date of Patent: August 25, 2020Assignee: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Jun Ye, Yupeng Cui, Liqun Han
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Patent number: 10690754Abstract: A scanning lidar system includes a fixed frame, a first platform flexibly attached to the fixed frame, a lens assembly including a first lens and a second lens mounted on the first platform, a second platform flexible attached to the fixed frame, an electro-optic assembly including a first laser source and a first photodetector mounted on the second platform, a drive mechanism mechanically coupled to the first platform and the second platform and configured to translate the first platform and the second platform with respect to the fixed frame, and a controller coupled to the drive mechanism and configured to translate the first platform to a plurality of first positions through the drive mechanism and translate the second platform to a plurality of second positions through the drive mechanism such that a motion of the second platform is substantially opposite to a motion of the first platform.Type: GrantFiled: December 13, 2017Date of Patent: June 23, 2020Assignee: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Jun Ye, Yupeng Cui, Liqun Han
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Patent number: 10451740Abstract: A lidar system includes a laser source, a photodetector, an emission lens, a receiving lens, and a processor. The laser source is configured to be translated through a plurality of emission locations, and to emit a plurality of laser pulses therefrom. The emission lens is configured to collimate and direct the plurality of laser pulses towards an object. The receiving lens is configured to focus the portion of each of the plurality of laser pulses reflected off of the object to a plurality of detection locations. The photodetector is configured to be translated through the plurality of detection locations, and to detect the portion of each of the plurality of laser pulses. The processor is configured to determine a time of flight for each of the plurality of laser pulses from emission to detection, and construct a three-dimensional image of the object based on the determined time of flight.Type: GrantFiled: September 16, 2016Date of Patent: October 22, 2019Assignee: CEPTON TECHNOLOGIES, INC.Inventors: Jun Pei, Mark McCord, Jun Ye
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Publication number: 20180180722Abstract: A scanning lidar system includes a first lens having a first lens center and characterized by a first optical axis and a first surface of best focus, a second lens having a second lens center and characterized by a second optical axis, a platform separated from the first lens and the second lens along the first optical axis, and an array of laser sources mounted on the platform. Each laser source of the array of laser sources has an emission surface lying substantially at the first surface of best focus of the first lens and positioned at a respective laser position. The scanning lidar system further includes an array of photodetectors mounted on the platform. Each photodetector of the array of photodetectors is positioned at a respective photodetector position that is optically conjugate with a respective laser position of a corresponding laser source.Type: ApplicationFiled: December 13, 2017Publication date: June 28, 2018Applicant: Cepton Tecnhologies, Inc.Inventors: Jun PEI, Mark MCCORD, Daryoosh Rejaly
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Publication number: 20180180720Abstract: A scanning lidar system includes a fixed frame, a first platform flexibly attached to the fixed frame, a lens assembly including a first lens and a second lens mounted on the first platform, a second platform flexible attached to the fixed frame, an electro-optic assembly including a first laser source and a first photodetector mounted on the second platform, a drive mechanism mechanically coupled to the first platform and the second platform and configured to translate the first platform and the second platform with respect to the fixed frame, and a controller coupled to the drive mechanism and configured to translate the first platform to a plurality of first positions through the drive mechanism and translate the second platform to a plurality of second positions through the drive mechanism such that a motion of the second platform is substantially opposite to a motion of the first platform.Type: ApplicationFiled: December 13, 2017Publication date: June 28, 2018Applicant: Cepton Tecnhologies, Inc.Inventors: Jun PEI, Mark MCCORD, Jun YE, Yupeng CUI, Liqun HAN
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Publication number: 20180180721Abstract: A scanning lidar system includes an external frame, an internal frame attached to the external frame by vibration-isolation mounts, and an electro-optic assembly movably attached to the internal frame and configured to be translated with respect to the internal frame during scanning operation of the scanning lidar system.Type: ApplicationFiled: December 13, 2017Publication date: June 28, 2018Applicant: Cepton Tecnhologies, Inc.Inventors: Jun PEI, Mark MCCORD, Jun YE, Yupeng CUI, Liqun HAN
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Patent number: 9874597Abstract: Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.Type: GrantFiled: April 27, 2015Date of Patent: January 23, 2018Assignee: KLA-Tenor CorporationInventors: Mark McCord, Alan Brodie, James George, Yu Guan, Ralph Nyffenegger
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Publication number: 20170307758Abstract: A lidar system includes a laser source, a photodetector, an emission lens, a receiving lens, and a processor. The laser source is configured to be translated through a plurality of emission locations, and to emit a plurality of laser pulses therefrom. The emission lens is configured to collimate and direct the plurality of laser pulses towards an object. The receiving lens is configured to focus the portion of each of the plurality of laser pulses reflected off of the object to a plurality of detection locations. The photodetector is configured to be translated through the plurality of detection locations, and to detect the portion of each of the plurality of laser pulses. The processor is configured to determine a time of flight for each of the plurality of laser pulses from emission to detection, and construct a three-dimensional image of the object based on the determined time of flight.Type: ApplicationFiled: September 16, 2016Publication date: October 26, 2017Applicant: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Jun Ye
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Publication number: 20170307759Abstract: A three-dimensional imaging system includes a lidar sensor having a first optical axis oriented at a first angle toward a scene and configured to determine a three-dimensional image of one or more first objects in the scene, and an optical three-dimensional sensor having a second optical axis oriented at a second angle toward the scene and configured to construct a three-dimensional image of one or more second objects in the scene. The first three-dimensional sensor is characterized by a first angular field of view. The second three-dimensional sensor is characterized by a second angular field of view different from the first angular field of view.Type: ApplicationFiled: October 7, 2016Publication date: October 26, 2017Applicant: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, June Ye
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Publication number: 20170310948Abstract: A three-dimensional imaging system includes a first illumination source configured to project a first fan of light toward an object in a field of view, and a second illumination source configured to project a second fan of light substantially parallel to and spaced apart from the first fan of light. The first illumination source and the second illumination source are further configured to scan the first fan of light and the second fan of light synchronously laterally across the field of view. The three-dimensional imaging system further includes a camera configured to capture a plurality of image frames of the field of view as the first fan of light and the second fan of light are scanned over a plurality of regions the object, and a processor coupled to the camera and configured to construct a three-dimensional image of the object based on the plurality of image frames.Type: ApplicationFiled: December 22, 2016Publication date: October 26, 2017Applicant: Cepton Technologies, Inc.Inventors: Jun Pei, Mark McCord, Jun Ye, Yupeng Cui, Liqun Han
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Publication number: 20170074810Abstract: A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.Type: ApplicationFiled: November 15, 2016Publication date: March 16, 2017Applicant: KLA-Tencor CorporationInventors: David L. ADLER, Kirk Bertsche, Mark McCord, Stuart Friedman
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Patent number: 9529279Abstract: A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.Type: GrantFiled: October 4, 2006Date of Patent: December 27, 2016Assignee: KLA-Tencor CorporationInventors: David Adler, Kirk Bertsche, Mark McCord, Stuart Friedman
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Publication number: 20150316604Abstract: Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.Type: ApplicationFiled: April 27, 2015Publication date: November 5, 2015Inventors: Mark MCCORD, Alan BRODIE, James GEORGE, Yu GUAN, Ralph NYFFENEGGER
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Publication number: 20150316411Abstract: The present disclosure provides methods and apparatus for testing light-emitting diodes (LEDs), for example, measuring the optical radiation of an LED. In a method, a pulse-width modulated signal is provided to the LED. One or more characteristics of the PWM signal are varied so as to provide a forward voltage, Vf, corresponding to a target junction temperature, Tj, of the LED. The optical radiation of the LED is measured when the LED obtains the target junction temperature.Type: ApplicationFiled: April 29, 2015Publication date: November 5, 2015Inventors: Mark McCord, Yu Guan, James George
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Patent number: 9170503Abstract: A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.Type: GrantFiled: October 4, 2006Date of Patent: October 27, 2015Assignee: KLA-Tencor CorporationInventors: David Adler, Kirk Bertsche, Mark McCord, Stuart Friedman
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Patent number: 9165742Abstract: Embodiments of the present disclosure are directed to an electron beam imaging/inspection apparatus having an electron source device to direct flood electrons on a sample immediately before image acquisition or inspection. The apparatus comprises a first device configured to charge a sample in a first mode, wherein the first device includes an electron source configured to provide a flood beam of charged particles to a first area of the sample. The apparatus also comprises a second device configured to generate a primary beam of electrons and characterize an interaction between the primary beam and a second area of the sample within the first area in a second mode. The apparatus is configured to switch from the first mode to the second mode less than 1 second.Type: GrantFiled: February 20, 2015Date of Patent: October 20, 2015Assignee: KLA-Tencor CorporationInventors: Richard Simmons, Douglas Masnaghetti, Mark McCord, Fred E Stanke, Scott Young, Christopher Sears