Patents by Inventor Mark Menard

Mark Menard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7705978
    Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
    Type: Grant
    Filed: February 6, 2006
    Date of Patent: April 27, 2010
    Assignee: Northrop Grumman Corporation
    Inventors: Mau-Song Chou, Jonathan W. Arenberg, Mark A. Menard
  • Patent number: 7326929
    Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.
    Type: Grant
    Filed: February 6, 2006
    Date of Patent: February 5, 2008
    Assignee: Northrop Grumman Corporation
    Inventors: Mau-Song Chou, Jonathan W. Arenberg, Mark A. Menard, Thomas T. Chung
  • Publication number: 20070181809
    Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.
    Type: Application
    Filed: February 6, 2006
    Publication date: August 9, 2007
    Inventors: Mau-Song Chou, Jonathan Arenberg, Mark Menard, Thomas Chung
  • Publication number: 20070181180
    Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
    Type: Application
    Filed: February 6, 2006
    Publication date: August 9, 2007
    Inventors: Mau-Song Chou, Jonathan Arenberg, Mark Menard