Patents by Inventor Mark Netschaevsky

Mark Netschaevsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Eddy current sensor for analyzing a test object and method of operating same
    Patent number: 6479990
    Abstract: A method for operating an eddy current sensor (10) with a measuring coil (2) and an evaluation circuit (4) for determining material or geometric parameters of a test object (5), in which the test object (5) is arranged at a distance (d) from the measuring coil (2). The impedance of the measuring coil (2) is evaluated, while the measuring coil (2) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit (4) determines the material and geometric parameters of the test object (5) based on the impedance of the measuring coil (2). The impedance of the measuring coil (2) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil (2) is determined at an alternating voltage of a second frequency, and the evaluation circuit (4) computes the material and geometric parameters of the test object (5) on the basis of the impedances of the measuring coil (2) at the first and the second frequencies.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: November 12, 2002
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Felix Mednikov, Roland Mandl, Mark Netschaevsky
  • Method for operating an eddy current sensor and eddy current sensor
    Publication number: 20010054896
    Abstract: A method for operating an eddy current sensor (10) with a measuring coil (2) and an evaluation circuit (4) for determining material or geometric parameters of a test object (5), in which the test object (5) is arranged at a distance (d) from the measuring coil (2). The impedance of the measuring coil (2) is evaluated, while the measuring coil (2) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit (4) determines the material and geometric parameters of the test object (5) based on the impedance of the measuring coil (2). The impedance of the measuring coil (2) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil (2) is determined at an alternating voltage of a second frequency, and the evaluation circuit (4) computes the material and geometric parameters of the test object (5) on the basis of the impedances of the measuring coil (2) at the first and the second frequencies.
    Type: Application
    Filed: June 18, 2001
    Publication date: December 27, 2001
    Applicant: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Felix Mednikov, Roland Mandl, Mark Netschaevsky