Patents by Inventor Mark P. Blodgett

Mark P. Blodgett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Atomic force microscopy system and method for nanoscale measurement
    Patent number: 8726410
    Abstract: An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.
    Type: Grant
    Filed: July 29, 2011
    Date of Patent: May 13, 2014
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Shamachary Sathish, Vijayaraghava Nalladega, Kumar V Jata, Mark P Blodgett
  • Atomic Force Microscopy System and Method for Nanoscale Measurement
    Publication number: 20120030846
    Abstract: An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.
    Type: Application
    Filed: July 29, 2011
    Publication date: February 2, 2012
    Applicant: Government of the United States, as represented by the Secretary of the Air Force
    Inventors: Shamachary Sathish, Vijayaraghava Nalladega, Kumar V. Jata, Mark P. Blodgett