Patents by Inventor Mark Perrin

Mark Perrin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050263389
    Abstract: A quadruple electromagnetic coil array coaxially arranged in a rectangular array about a chamber axis outside the sidewalls of a plasma sputter reactor, preferably in back of an RF coil within the chamber. The coil currents can be separately controlled to produce different magnetic field distributions, for example, between a sputter deposition mode in which the sputter target is powered to sputter target material onto a wafer and a sputter etch mode in which the RF coil supports the gas sputtering the wafer. The coil array may include a tubular magnetic core, particularly useful for suppressing stray fields. A water cooling coil may be wrapped around the coil array to cool all the coils. The electromagnets can be powered in different relative polarities in a multi-step process.
    Type: Application
    Filed: September 23, 2004
    Publication date: December 1, 2005
    Inventors: Tza-Jing Gung, Mark Perrin, Andrew Gillard
  • Publication number: 20050263390
    Abstract: A multi-step process performed in a plasma sputter chamber including sputter deposition from the target and argon sputter etching of the substrate. The chamber includes a quadruple electromagnetic coil array coaxially arranged in a rectangular array about a chamber axis outside the sidewalls of a plasma sputter reactor in back of an RF coil within the chamber. The coil currents can be separately controlled to produce different magnetic field distributions, for example, between a sputter deposition mode in which the sputter target is powered to sputter target material onto a wafer and a sputter etch mode in which the RF coil supports the argon sputtering plasma. A TaN/Ta barrier is first sputter deposited with high target power and wafer bias. Argon etching is performed with even higher wafer bias. A flash step is applied with reduced target power and wafer bias.
    Type: Application
    Filed: April 29, 2005
    Publication date: December 1, 2005
    Inventors: Tza-Jing Gung, Xinyu Fu, Arvind Sundarrajan, Edward Hammond, Praburam Gopalraja, John Forster, Mark Perrin, Andrew Gillard
  • Publication number: 20030178143
    Abstract: A plasma reactor includes a vacuum chamber having an interior and a pedestal within the chamber for supporting a semiconductor wafer to be processed. Gas distribution apparatus introduces a process gas into said chamber. Power is applied to the chamber by plural concentric coaxial waveguides outside of said chamber having an axis of propagation pointing toward the interior of said chamber and establishing corresponding annular zones of radiation within said chamber. The reactor further includes apparatus that can apply different levels of electromagnetic radiation power to different ones of the plural concentric coaxial waveguides.
    Type: Application
    Filed: March 25, 2002
    Publication date: September 25, 2003
    Applicant: Applied Materials, Inc.
    Inventor: Mark Perrin