Patents by Inventor Mark Polizzi

Mark Polizzi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for nonlinear optical null ellipsometry
    Patent number: 7336359
    Abstract: Nonlinear optical null ellipsometry is disclosed as a method to evaluate second-order nonlinearities on and off resonance in thin surface films and bulk materials.
    Type: Grant
    Filed: May 3, 2005
    Date of Patent: February 26, 2008
    Assignee: Purdue Research Foundation
    Inventors: Garth J. Simpson, Ryan M. Plocinik, Mark Polizzi