Patents by Inventor Mark R. King

Mark R. King has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5793525
    Abstract: An apparatus for adjusting a viewing angle of a microscope is disclosed. In a preferred embodiment thereof, a bent eyepiece tube includes a prism on a first optical axis thereof for redirecting an object image to a second optical axis of the tube on which a magnifying eyepiece is aligned. The eyepiece tube is mounted on the microscope for rotation about the first optical axis by a collar, and a spring plunger carried by the tube is biased for respective engagement with a pair of opposing recesses in the collar to releasably secure the eyepiece tube in predetermined rotational positions corresponding to a pair of different viewing angles.
    Type: Grant
    Filed: September 22, 1995
    Date of Patent: August 11, 1998
    Assignee: Leica Inc.
    Inventors: Jeffrey M. Sabin, Christopher L. Wyatt, Mark R. King
  • Patent number: 5301012
    Abstract: Sensitivity and resolution of an automated inspection system are improved and data processing loads for defect detection are reduced, increasing inspection speed, by fully illuminating an area corresponding to a nominal feature shape formed on a surface. Scanning of the illuminated area thus provides resolution of defects far smaller than the area of the illuminated spot. A preferred application of this automated inspection system is for the high speed screening of lamina or substrates having a pattern of through-holes formed therein, particularly for the formation of via connections therein. Screening for insufficient clear area of through-holes is done simply by applying a threshold to the output representing the amount of illumination transmitted and preferably reflected through the through-hole.
    Type: Grant
    Filed: October 30, 1992
    Date of Patent: April 5, 1994
    Assignee: International Business Machines Corporation
    Inventors: Mark R. King, Wendell B. Scism
  • Patent number: 5288991
    Abstract: An inspection system in which the surface of a substrate is continuously scanned by a linear CCD. The surface is illuminated in a narrowly focused strip from a broad-band light source that is selectively wavelength filtered to optimize image contrast to the optical characteristics of the surface under inspection. A channel integrator in the light source optical system provides illumination homogeneity at the surface of the substrate.
    Type: Grant
    Filed: December 4, 1992
    Date of Patent: February 22, 1994
    Assignee: International Business Machines Corporation
    Inventors: Mark R. King, William H. Vonderhaar