Patents by Inventor Mark Reid

Mark Reid has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6322994
    Abstract: A method is provided for freeze-drying multiple samples of viable microorganisms which method comprises: (i) providing a container comprising multiple wells; (ii) dispensing multiple liquid samples, each sample comprising a viable microorganism, into separate wells of the container; (iii) placing the container in a freeze-drying apparatus; and (iv) freeze-drying the samples present in the wells under conditions that substantially maintain the viability of the microorganisms. Also provided is a container comprising multiple wells, each well comprising a viable freeze-dried sample of a microorganism.
    Type: Grant
    Filed: November 4, 1999
    Date of Patent: November 27, 2001
    Assignee: Genetix Limited
    Inventor: Mark Reid
  • Patent number: 6219930
    Abstract: A method of use and apparatus for estimating repair cost, particularly applicable to cost estimation of interspaced defect damaged vehicle surfaces. The method of use of the present invention provides that a defect count be made for a predetermined representative area; that a determination of relative severity be made with respect to at least one defect within the representative area; and that the repair estimate is then based upon the defect count information and defect severity. A set of physical templates may be provided, with a first template allowing the calculation of the number of dents per surface area, and a second template for grading, comparing, or otherwise determining the size or severity of the individual dents. Additionally, the defect count data and defect severity data may be determined with an electronic scanning means. Various formulae may be employed (manually or electronically) for calculating the cost estimate to repair the damaged surface.
    Type: Grant
    Filed: December 18, 1998
    Date of Patent: April 24, 2001
    Inventor: Mark Reid
  • Patent number: 5768017
    Abstract: A system for creating a bright and uniform line of illumination. The "hot spot" of an arc lamp is imaged onto a narrow, circular pinhole aperture. Light passing through the pinhole aperture is collimated and passed through a second aperture (the apodizing aperture), before being focused to a line of illumination by a cylindrical lens. The spatial profile of the apodizing aperture is tailored to remove non-uniformities in the illumination source thereby allowing a highly uniform line of illumination to be created. Alternatively, the spatial profile of the apodizing aperture can be tailored to produce a line of illumination having a desired non-uniform intensity profile.
    Type: Grant
    Filed: July 22, 1996
    Date of Patent: June 16, 1998
    Assignee: International Business Machines Corporation
    Inventors: Mark Reid King, Scott Marshall Mansfield, William Harry Vonderhaar