Patents by Inventor Mark Richard Stade

Mark Richard Stade has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for mapping defects on the light transmissive support surface of a document scanning or photocopying device
    Patent number: 7242797
    Abstract: The invention is directed to a method and apparatus for mapping defects on a light transmissive support surface of a document scanning or photocopying device. The method includes a step of cleaning the support surface between steps of operating the device so as to reflect light from defects associated with the support surface. At least a selected characteristic of the reflected light, such as its intensity, at predetermined pixel locations before the step of cleaning is compared with the same characteristic of the reflected light at the same pixel locations after the step of cleaning. A selected pixel location is mapped to a defect map if (1) the characteristic for reflected light is substantially equal for the selected pixel location at each step of operating the device, and (2) the characteristic for the reflected light at a step of operating the device substantially meets a predetermined standard.
    Type: Grant
    Filed: June 5, 2003
    Date of Patent: July 10, 2007
    Assignee: Seiko Epson Corporation
    Inventor: Mark Richard Stade
  • Method and apparatus for mapping defects on the light transmissive support surface of a document scanning or photocopying device
    Publication number: 20040247202
    Abstract: The invention is directed to a method and apparatus for mapping defects on a light transmissive support surface of a document scanning or photocopying device. The method includes a step of cleaning the support surface between steps of operating the device so as to reflect light from defects associated with the support surface. At least a selected characteristic of the reflected light, such as its intensity, at predetermined pixel locations before the step of cleaning is compared with the same characteristic of the reflected light at the same pixel locations after the step of cleaning. A selected pixel location is mapped to a defect map if (1) the characteristic for reflected light is substantially equal for the selected pixel location at each step of operating the device, and (2) the characteristic for the reflected light at a step of operating the device substantially meets a predetermined standard.
    Type: Application
    Filed: June 5, 2003
    Publication date: December 9, 2004
    Inventor: Mark Richard Stade