Patents by Inventor Mark Robert DENOME

Mark Robert DENOME has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240167197
    Abstract: A process, for example a continuous process, for making an article of manufacture containing a fibrous structure, for example a composite structure, and more particularly to a process for making an article of manufacture containing a fibrous structure, such as a soluble fibrous structure, containing soluble filaments is provided.
    Type: Application
    Filed: February 2, 2024
    Publication date: May 23, 2024
    Inventors: Anthony Edward REED, Michael Sean PRATT, Paul R. MORT, III, Stephen Robert GLASSMEYER, Dinah Achola NYANGIRO, Mark William HAMERSKY, Richard Allen DIEMAR, Jeffrey Moss VAUGHN, Gavin John BROAD, Gregory Charles GORDON, Frank William DENOME, Mark Robert SIVIK, Andreas Josef DREHER
  • Patent number: 11944696
    Abstract: A detergent product containing one or more active agents is provided.
    Type: Grant
    Filed: January 15, 2021
    Date of Patent: April 2, 2024
    Assignee: The Procter & Gamble Company
    Inventors: Mark Robert Sivik, Gregory Charles Gordon, Frank William Denome, Alyssandrea Hope Hamad-Ebrahimpour, Stephen Joseph Hodson, Brian Patrick Croll, John Gerhard Michael, Andreas Josef Dreher, Paul Dennis Trokhan
  • Patent number: 10942507
    Abstract: A method includes determining, by a processing device, a first eco-efficiency characterization associated with a first design of manufacturing equipment based on one or more of water eco-efficiency characterization, emissions eco-efficiency characterization, or electrical energy eco-efficiency characterization. The water eco-efficiency characterization, the emissions eco-efficiency characterization, the electrical energy eco-efficiency characterization, and the first eco-efficiency characterization are associated with an amount of environmental impact generated by the manufacturing equipment per unit product produced by the manufacturing equipment. The method further includes comparing the first eco-efficiency characterization to a second eco-efficiency characterization that is associated with a second design of the manufacturing equipment.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: March 9, 2021
    Assignee: Applied Materials, Inc.
    Inventors: Mark Robert Denome, Vijayakumar Venugopal, Ashish Kumar, Vijai Thangamany, Somil Kapdia, Ching-Hong Hsieh
  • Publication number: 20190155265
    Abstract: A method includes determining, by a processing device, a first eco-efficiency characterization associated with a first design of manufacturing equipment based on one or more of water eco-efficiency characterization, emissions eco-efficiency characterization, or electrical energy eco-efficiency characterization. The water eco-efficiency characterization, the emissions eco-efficiency characterization, the electrical energy eco-efficiency characterization, and the first eco-efficiency characterization are associated with an amount of environmental impact generated by the manufacturing equipment per unit product produced by the manufacturing equipment. The method further includes comparing the first eco-efficiency characterization to a second eco-efficiency characterization that is associated with a second design of the manufacturing equipment.
    Type: Application
    Filed: January 18, 2019
    Publication date: May 23, 2019
    Inventors: Mark Robert DENOME, Vijayakumar VENUGOPAL, Ashish KUMAR, Vijai THANGAMANY, Somil KAPDIA, Ching-Hong HSIEH
  • Patent number: 10185313
    Abstract: A method for wafer point by point analysis includes receiving a selection of manufacturing equipment, utility use data, and utilization data. A water eco-efficiency characterization is calculated based on the utilization data and the utility use data. An emissions eco-efficiency characterization is calculated based on the utilization data and the utility use data. An electrical energy eco-efficiency characterization is calculated based on the utilization data and the utility use data. A combined eco-efficiency characterization is calculated based on the utilization data and water eco-efficiency characterization, emissions eco-efficiency characterization, and electrical energy eco-efficiency characterizations. The combined eco-efficiency characterization is provided for display by a graphical user interface.
    Type: Grant
    Filed: April 20, 2016
    Date of Patent: January 22, 2019
    Assignee: Applied Materials, Inc.
    Inventors: Mark Robert Denome, Vijayakumar Venugopal, Ashish Kumar, Vijai Thangamany, Somil Kapadia, Ching-Hong Hsieh
  • Publication number: 20170308071
    Abstract: A method for wafer point by point analysis includes receiving a selection of manufacturing equipment, utility use data, and utilization data. A water eco-efficiency characterization is calculated based on the utilization data and the utility use data. An emissions eco-efficiency characterization is calculated based on the utilization data and the utility use data. An electrical energy eco-efficiency characterization is calculated based on the utilization data and the utility use data. A combined eco-efficiency characterization is calculated based on the utilization data and water eco-efficiency characterization, emissions eco-efficiency characterization, and electrical energy eco-efficiency characterizations. The combined eco-efficiency characterization is provided for display by a graphical user interface.
    Type: Application
    Filed: April 20, 2016
    Publication date: October 26, 2017
    Inventors: Mark Robert DENOME, Vijayakumar VENUGOPAL, Ashish KUMAR, Vijai THANGAMANY, Somil KAPADIA, Ching-Hong HSIEH
  • Patent number: D1023781
    Type: Grant
    Filed: January 7, 2021
    Date of Patent: April 23, 2024
    Assignee: The Procter & Gamble Company
    Inventors: Sun-Jan Alan Huang, Mark Robert Sivik, Frank William Denome, Christopher Lee Haun