Patents by Inventor Mark Sharnoff

Mark Sharnoff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5216527
    Abstract: A method and apparatus for the collation or fine comparison of closely related images made with coherent light, such as those that may arise in holographic interferometry, in holo-photoelasticity, or in speckle interferometry.
    Type: Grant
    Filed: October 30, 1991
    Date of Patent: June 1, 1993
    Inventors: Mark Sharnoff, Hungyi Lin
  • Patent number: 4910759
    Abstract: A lens and collimator apparatus for focusing and increasing the intensity of an x-ray beam at a specimen point. A screen with an aperture of pupil diameter comparable and no larger than the x-ray transverse coherence length and no smaller that the specimen diameter focuses the x-ray beam by diffraction. The screen is positioned from the specimen plane proportional to the ratio of the square of the pupil diameter to the mean wavelength of the x-ray beam. A plurality of parallel screens can also be used.
    Type: Grant
    Filed: May 3, 1988
    Date of Patent: March 20, 1990
    Assignee: University of Delaware
    Inventor: Mark Sharnoff
  • Patent number: 4725142
    Abstract: A method and apparatus for holographic inspection adapted to the determination and characterization of intermittent stressing of objects.
    Type: Grant
    Filed: August 11, 1986
    Date of Patent: February 16, 1988
    Assignee: University of Delaware
    Inventor: Mark Sharnoff