Patents by Inventor Mark Stachew

Mark Stachew has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built-in self test for A/D converter
    Patent number: 10474553
    Abstract: Analog-to-digital conversion is tested in-field using an on-chip built-in self-test (BIST) sub-circuit formed within an underlying integrated circuit. Processing cycles may be conscripted during an idle state when the analog-to-digital conversion is not needed. The BIST requires a test time which may be compared to an idle time. If the idle time exceeds the test time, then the BIST may be entirely performed. However, if the idle time is unknown or less than the test time, the BIST may be paused and resumed between subsequent idle states.
    Type: Grant
    Filed: July 18, 2017
    Date of Patent: November 12, 2019
    Assignee: NXP USA, Inc.
    Inventors: Xiankun Jin, Mark Stachew
  • BUILT-IN SELF TEST FOR A/D CONVERTER
    Publication number: 20190026205
    Abstract: Analog-to-digital conversion is tested in-field using an on-chip built-in self-test (BIST) sub-circuit formed within an underlying integrated circuit. Processing cycles may be conscripted during an idle state when the analog-to-digital conversion is not needed. The BIST requires a test time which may be compared to an idle time. If the idle time exceeds the test time, then the BIST may be entirely performed. However, if the idle time is unknown or less than the test time, the BIST may be paused and resumed between subsequent idle states.
    Type: Application
    Filed: July 18, 2017
    Publication date: January 24, 2019
    Inventors: Xiankun Jin, Mark Stachew