Abstract: A technique for automatically diagnosing the failure of electronic devices connected to share a common bus. All bus devices are first disabled, and the bus is examined to determine if a failed device is interfering with normal operation by causing the bus to be stuck at a logic high or a logic low level. If the bus is stuck low or high, a forcing voltage nearly equal to either V.sub.ol or V.sub.oh, respectively, is applied to the bus, with all devices still disabled. A disabled bus current is then measured. One at a time, the bus devices are enabled, and the current on the bus measured to determine an enabled bus current. If, for a particular device, the enabled bus current exceeds the disabled bus current by a predetermined amount depending on the drive current specification of the device, it is concluded that the particular device is operating properly.

Abstract: This disclosure is concerned with suppressing spurious signals generated during the in-circuit testing of circuit components, and which spurious signals may interfere with test signals being forced at selected nodes of the circuit that are inputs to components being tested and wherein such spurious signals may be routed via certain of the other circuit components, by automatically inhibiting either potential transmission of spurious signals by applying specific signals to components identified by analysis as normally feeding or processing input signals to the component(s) under test, or automatically inhibiting all inhibitable input parts of all components identified as those capable of passing such spurious signals to the input of the component(s) under test.