Patents by Inventor Mark T. Kachelmeier

Mark T. Kachelmeier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6707112
    Abstract: The invention relates to a transistor having a ramped gate oxide thickness, a semiconductor device containing the same and a method for making a transistor.
    Type: Grant
    Filed: June 4, 2002
    Date of Patent: March 16, 2004
    Assignee: Cypress Semiconductor Corporation
    Inventor: Mark T. Kachelmeier
  • Publication number: 20020145166
    Abstract: The invention relates to a transistor having a ramped gate oxide thickness, a semiconductor device containing the same and a method for making a transistor.
    Type: Application
    Filed: June 4, 2002
    Publication date: October 10, 2002
    Applicant: CYPRESS SEMICONDUCTOR CORPORATION
    Inventor: Mark T. Kachelmeier
  • Patent number: 5897354
    Abstract: The invention relates to a method of forming a non-volatile memory device with a ramped tunnel dielectric layer, in which a floating gate material layer is being oxidized such that a tunnel dielectric layer is formed having a thickness at a drain region edge which is greater than a thickness at a source region edge.
    Type: Grant
    Filed: December 17, 1996
    Date of Patent: April 27, 1999
    Assignee: Cypress Semiconductor Corporation
    Inventor: Mark T. Kachelmeier
  • Patent number: 5741737
    Abstract: The invention relates to a transistor having a ramped gate oxide thickness, a semiconductor device containing the same and a method for making a transistor.
    Type: Grant
    Filed: December 17, 1996
    Date of Patent: April 21, 1998
    Assignee: Cypress Semiconductor Corporation
    Inventor: Mark T. Kachelmeier