Abstract: Methods, systems, and apparatus for testing semiconductor devices.

Abstract: Methods, systems, and apparatus for testing semiconductor devices.

Abstract: Methods, systems, and apparatus for testing semiconductor devices.

Abstract: Methods, systems, and apparatus for testing semiconductor devices.

Abstract: A system includes a first integrated circuit configured to operate in at least a normal mode and a test mode and a second integrated circuit, where both the first integrated circuit and the second integrated circuit are disposed within a same semiconductor device package. The system further includes a first terminal, external to the semiconductor device package, electronically coupled to the first integrated circuit and the second integrated circuit. The first terminal is electronically coupled to a buffer in the second integrated circuit and used to convey signals to or from the first integrated circuit.

Abstract: Methods, systems, and apparatus for testing semiconductor devices.

Abstract: Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.

Abstract: Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.

Abstract: Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.

Abstract: Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.

Abstract: Systems, devices, and methods for a double data rate memory device includes a storage element, a first pipeline, and a second pipeline. The pipelines are connected to the storage unit to pass or output data on rising and falling edges of an external clock signal. The device permits data transferring at dual data rates. Another memory device includes a storage element and a plurality of pipelines for transferring data. The plurality of pipelines each pass data on different events.

Abstract: A method and apparatus for testing a memory device with compressed data using multiple clock edges is disclosed. In one embodiment of the present invention data is written to cells in a memory device, the cells are read to generate read data, the read data is compressed to generate test data, and the test data is produced at a single output on edges of a clock signal.

Abstract: A memory device includes delay locked loop that generates an internal signal based on an external signal. The internal signal serves a reference clock signal for most modes operations of the memory device. In a self refresh mode, the delay locked loop is completely deactivated to completely deactivate the internal signal. In a non-self refresh mode, the delay locked loop is periodically deactivated to periodically deactivate the internal signal based on certain modes of operations of the memory device.

Abstract: A high speed cyclical redundancy check system for use in digital systems. The high speed cyclical redundancy check system providing programmable error correction functions for different data protocols. The high speed cyclical redundancy check system providing programmable data paths for minimizing overhead and maximizing throughput. The system supporting multiple operations in a single cycle.

Abstract: A high speed cyclical redundancy check system for use in digital systems. The high speed cyclical redundancy check system providing programmable error correction functions for different data protocols. The high speed cyclical redundancy check system providing programmable data paths for minimizing overhead and maximizing throughput. The system supporting multiple operations in a single cycle.

Abstract: A programmable multiconfiguration data port clocking system for use in asynchronous transfer mode communication (ATM) networks. The clocking system is programmed using a number of preselected configuration codes to automatically switch the clocking of the data port configuration of an ATM network chip. The clocking system incorporates an automatic disable circuit for eliminating random outputs from unused pins in the clocking hardware. The clocking system also employs a noise suppression circuit for reducing spurious noise into the ATM network.

Abstract: An ATM switch including a multi-port memory is described. The multi-port memory having a dynamic random access memory (DRAM) and a plurality of input and output serial access memories (SAMs). Efficient, flexible transfer circuits and methods are described for transferring ATM data between the SAMs and the DRAM. The transfer circuits and methods include helper flip/flops to latch ATM data for editing prior to storage in the DRAM. Editing of ATM data transferred from the DRAM is also described. Dynamic parity generation and checking is described to detect errors induced during switching.

Abstract: A multiport interface for digital communication systems having pipelined multiplexing of port instructions for increased throughput. The multiport interface includes an analog delay for independent timing of asynchronous operations, such as memory accesses. The multiport interface also has an instruction pipeline and multiplexer to coordinate a number of port instructions.

Abstract: A programmable multiconfiguration data port clocking system for use in asynchronous transfer mode communication (ATM) networks. The clocking system is programmed using a number of preselected configuration codes to automatically switch the clocking of the data port configuration of an ATM network chip. The clocking system incorporates an automatic disable circuit for eliminating random outputs from unused pins in the clocking hardware. The clocking system also employs a noise suppression circuit for reducing spurious noise into the ATM network.

Abstract: A multiport interface for digital communication systems having pipelined multiplexing of port instructions for increased throughput. The multiport interface includes an analog delay for independent timing of asynchronous operations, such as memory accesses. The multiport interface also has an instruction pipeline and multiplexer to coordinate a number of port instructions.