Patents by Inventor Mark Trentelman

Mark Trentelman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7924406
    Abstract: An illuminator for a lithographic apparatus includes a first illuminator channel, a second illuminator channel, a first switch device, an additional illuminator part and a second switch device. Each of the first and the second illuminator channel includes elements which are adjustable to provide a radiation beam with at least one desired property. The first switch device is configured to receive the radiation beam and arranged to direct the radiation beam between the first and second illuminator channels. The second switch device is arranged to receive the radiation beam from the first and second illuminator channels and direct the radiation beam through the additional illuminator part. The additional illuminator part includes elements which apply at least one additional desired property to the radiation beam.
    Type: Grant
    Filed: June 2, 2006
    Date of Patent: April 12, 2011
    Assignee: ASML Netherlands B.V.
    Inventors: Erik Roelof Loopstra, Arno Jan Bleeker, Heine Melle Mulder, Oscar Franciscus Jozephus Noordman, Timotheus Franciscus Sengers, Laurentius Catrinus Jorritsma, Mark Trentelman, Gerrit Streutker
  • Patent number: 7868999
    Abstract: A lithographic apparatus is disclosed that has a plurality of control circuits, each control circuit arranged to be connected to an associated radiation source of a plurality of radiation sources configured to generate pulses of radiation for projection onto a substrate and each control circuit arranged to control the energy of radiation pulses generated by that associated radiation source.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: January 11, 2011
    Assignee: ASML Netherlands B.V.
    Inventors: Johannes Heintze, Erik Petrus Buurman, Mark Trentelman
  • Patent number: 7671968
    Abstract: A lithographic apparatus includes a masking device that includes a first masking part configured to obscure a first part of a first patterning device before the pattern of the first patterning device is impinged by a radiation beam, a second masking part having an adjustable length, the second masking part configured to obscure a second part of the first patterning device after the pattern of the first patterning device is impinged by the radiation beam and to obscure a first part of a second patterning device before the pattern of the second patterning device is impinged by the radiation beam, and a third masking part configured to obscure a second part of the second patterning device after the pattern of the second patterning device is impinged by the radiation beam.
    Type: Grant
    Filed: July 14, 2006
    Date of Patent: March 2, 2010
    Assignee: ASML Netherlands B.V.
    Inventors: Erik Roelof Loopstra, Arno Jan Bleeker, Heine Melle Mulder, Oscar Franciscus Jozephus Noordman, Timotheus Franciscus Sengers, Laurentius Catrinus Jorritsma, Mark Trentelman, Gerrit Streutker
  • Patent number: 7432517
    Abstract: A pulse modifying unit is provided in the illumination system of the lithographic apparatus to reduce the degradation of the expensive lens elements by billions of the high intensity ultraviolet pulses from the laser is configured to receive an input pulse of radiation along a first optical axis and further configured to emit one or more corresponding output pulses of radiation along a second optical axis, including a divider disposed along the first optical axis and configured to divide the incoming pulse into a first and a second pulse portion, wherein the divider is further configured to direct the first pulse portion along the second optical axis. A first and a second mirror, each with a radius of curvature, are disposed facing each other with a predetermined separation, configured to receive the second pulse portion and to redirect the second portion along the second optical axis.
    Type: Grant
    Filed: November 10, 2005
    Date of Patent: October 7, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Hako Botma, Joerg Bruebach, Mark Trentelman, Adel Joobeur
  • Publication number: 20080036991
    Abstract: A lithographic apparatus is disclosed that has a plurality of control circuits, each control circuit arranged to be connected to an associated radiation source of a plurality of radiation sources configured to generate pulses of radiation for projection onto a substrate and each control circuit arranged to control the energy of radiation pulses generated by that associated radiation source.
    Type: Application
    Filed: August 10, 2006
    Publication date: February 14, 2008
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Johannes Heintze, Erik Petrus Buurman, Mark Trentelman
  • Publication number: 20070013885
    Abstract: In order to improve the productivity of a lithographic apparatus, a stage apparatus to hold two patterning devices is described. The patterning devices are arranged such that the distance between the patterns in the scanning direction corresponds to the length of the pattern in the scanning direction. By doing so, an improved exposure sequence may be performed by exposing a first die with a first pattern, skipping a second die adjacent to the first die, and exposing a third die adjacent to the second die using a second pattern.
    Type: Application
    Filed: July 14, 2006
    Publication date: January 18, 2007
    Applicant: ASML Netherlands B.V.
    Inventors: Erik Loopstra, Arno Bleeker, Heine Mulder, Oscar Franciscus Noordman, Timotheus Sengers, Laurentius Jorritsma, Mark Trentelman, Gerrit Streutker
  • Publication number: 20070013890
    Abstract: In order to improve the productivity of a lithographic apparatus, a stage apparatus for holding two patterning devices is described. The patterning devices are arranged such that the distance between the patterns in the scanning direction corresponds to the length of the pattern in the scanning direction. By doing so, an improved exposure sequence may be performed by exposing a first die with a first pattern, skipping a second die adjacent to the first die, and exposing a third die adjacent to the second die using a second pattern.
    Type: Application
    Filed: June 2, 2006
    Publication date: January 18, 2007
    Applicant: ASML Netherlands B.V.
    Inventors: Erik Loopstra, Arno Bleeker, Heine Mulder, Oscar Franciscus Noordman, Timotheus Sengers, Laurentius Jorritsma, Mark Trentelman, Gerrit Streutker
  • Publication number: 20060126681
    Abstract: A pulse modifying unit is provided in the illumination system of the lithographic apparatus to reduce the degradation of the expensive lens elements by billions of the high intensity ultraviolet pulses from the laser is configured to receive an input pulse of radiation along a first optical axis and further configured to emit one or more corresponding output pulses of radiation along a second optical axis, including a divider disposed along the first optical axis and configured to divide the incoming pulse into a first and a second pulse portion, wherein the divider is further configured to direct the first pulse portion along the second optical axis. A first and a second mirror, each with a radius of curvature, are disposed facing each other with a predetermined separation, configured to receive the second pulse portion and to redirect the second portion along the second optical axis.
    Type: Application
    Filed: November 10, 2005
    Publication date: June 15, 2006
    Applicants: ASML Netherlands B.V, ASML Holding N.V.
    Inventors: Hako Botma, Joerg Bruebach, Mark Trentelman, Adel Joobeur