Patents by Inventor Mark Tronolone

Mark Tronolone has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070003163
    Abstract: Local data maps of an optical imaging system are stitched together into a composite global data map based on a merit function supporting closed-form processing. Overlapping regions of the local data maps are defined as difference maps that are given a parametric description. Corrective orientations of the local data maps are derived by collectively matching parametric descriptions of the corrective orientations for the overlapping local data maps to the parametric descriptions of the corresponding difference maps.
    Type: Application
    Filed: June 30, 2005
    Publication date: January 4, 2007
    Applicant: CORNING INCORPORATED
    Inventors: Simon Lee, Donald McClimans, Mark Tronolone
  • Publication number: 20060233205
    Abstract: An external cavity laser includes a lasing cavity and an optically coupled feedback cavity having differently spaced resonant lasing and feedback mode frequencies. The lasing modes can be collectively or individually matched to selected feedback modes. For example, a current driving the lasing cavity can be adjusted to shift individual lasing modes into alignment with the selected feedback modes.
    Type: Application
    Filed: April 13, 2006
    Publication date: October 19, 2006
    Inventors: Nestor Farmiga, Michael Litzenberger, Mark Tronolone
  • Publication number: 20060139656
    Abstract: Two common-path interferometers share a measuring cavity for measuring opposite sides of opaque test parts. Interference patterns are formed between one side of the test parts and the reference surface of a first of the two interferometers, between the other side of the test parts and the reference surface of a second of the two interferometers, and between the first and second reference surfaces. The latter measurement between the reference surfaces of the two interferometers enables the measurements of the opposite sides of the test parts to be related to each other.
    Type: Application
    Filed: December 23, 2004
    Publication date: June 29, 2006
    Applicant: Corning Incorporated
    Inventors: Andrew Kulawiec, Mark Tronolone, Thomas Dunn, Joseph Marron
  • Publication number: 20060061773
    Abstract: Frequency-scanning interferometry is used for measuring test objects having multiple surface regions. The regions are distinguished and can be measured based on different measuring criteria. Interference data is gathered for the imageable portion of the test object from a plurality of interference patterns taken over substantially the same imageable portion at different measuring beam frequencies. The interference data is evaluated to determine topographical measures of associated points on the test object. The topographical measures are compared against a benchmark to distinguish between points on the test object that are within a first of the surface regions from points on a boundary separating the first surface region from one or more other surface regions of the imageable portion of the test object. The interference data of points within the first surface region are further evaluated to a higher accuracy.
    Type: Application
    Filed: September 22, 2004
    Publication date: March 23, 2006
    Inventors: Christopher Lee, Andrew Kulawiec, Mark Tronolone
  • Publication number: 20060061772
    Abstract: A frequency-shifting interferometer gathers intensity data from a set of interference patterns produced at different measuring beam frequencies. A periodic function is matched to the intensity data gathered from the set of interference patterns over a corresponding range of measuring beam frequencies. Localized correlations involving phase offsets between the interfering portions of the measuring beam are used to inform a determination of a rate of phase change with measuring beam frequency corresponding to the optical path length difference between the interfering beam portions.
    Type: Application
    Filed: September 22, 2004
    Publication date: March 23, 2006
    Inventors: Andrew Kulawiec, Joseph Marron, Don McClimans, Mark Tronolone