Patents by Inventor Mark Van Benthem

Mark Van Benthem has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Global analysis peak fitting for chemical spectroscopy data
    Patent number: 10551247
    Abstract: The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.
    Type: Grant
    Filed: March 28, 2016
    Date of Patent: February 4, 2020
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Mark Van Benthem, James A. Ohlhausen