Patents by Inventor Mark W. Dryfuse

Mark W. Dryfuse has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In die stepping sort
    Patent number: 10429439
    Abstract: An apparatus for testing a die can comprise a first printed circuit board (PCB), a space transformer, and a plurality of probes. The first PCB can be configured to connect to a second PCB. The space transformer can be attached to the PCB. The space transformer can include a plurality of traces. Each of the plurality of probes can be connected to one of the plurality of traces.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: October 1, 2019
    Assignee: Intel Corporation
    Inventors: Dae-Woo Kim, J. Daniel Bryan, Joseph W. Parks, Jr., Ethan Caughey, Mark W. Dryfuse
  • IN DIE STEPPING SORT
    Publication number: 20180003765
    Abstract: An apparatus for testing a die can comprise a first printed circuit board (PCB), a space transformer, and a plurality of probes. The first PCB can be configured to connect to a second PCB. The space transformer can be attached to the PCB. The space transformer can include a plurality of traces. Each of the plurality of probes can be connected to one of the plurality of traces. The plurality of probes can be arranged in a pattern having a pitch less than 65 microns.
    Type: Application
    Filed: July 1, 2016
    Publication date: January 4, 2018
    Inventors: Dae-Woo Kim, J. Daniel Bryan, Joseph W. Parks, JR., Ethan Caughey, Mark W. Dryfuse
  • Sort Probe Over Current Protection Mechanism
    Publication number: 20150077150
    Abstract: An apparatus includes a probe card, a plurality of sort probes coupled to the probe card and detector circuitry to detect a real time over current occurrence at the sort probes.
    Type: Application
    Filed: November 25, 2014
    Publication date: March 19, 2015
    Inventors: Benjamin J. Norris, Pooya Tadayon, Mark W. Dryfuse
  • Sort probe over current protection mechanism
    Patent number: 8937794
    Abstract: An apparatus includes a probe card, a plurality of sort probes coupled to the probe card and detector circuitry to detect a real time over current occurrence at the sort probes.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: January 20, 2015
    Assignee: Intel Corporation
    Inventors: Benjamin J. Norris, Pooya Tadayon, Mark W. Dryfuse
  • SORT PROBE OVER CURRENT PROTECTION MECHANISM
    Publication number: 20140092505
    Abstract: An apparatus includes a probe card, a plurality of sort probes coupled to the probe card and detector circuitry to detect a real time over current occurrence at the sort probes.
    Type: Application
    Filed: September 28, 2012
    Publication date: April 3, 2014
    Inventors: Benjamin J. Norris, Pooya Tadayon, Mark W. Dryfuse