Patents by Inventor Mark W. Jenkins

Mark W. Jenkins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240068238
    Abstract: The present disclosure relates generally to roofing products, for example, suitable for use covering and protecting the roofs of structures. The present disclosure relates more particularly to a roofing product including an upper section and an exposed section. The roofing product includes a substrate having a top surface and a bottom surface, and a plurality of zones of roofing granules disposed on the top surface of the substrate. The plurality of zones includes first, second and third zones within the exposed section. The first zone includes a first collection of algae-resistant roofing granules and has a first algae-resistance intensity. The second zone includes a second collection of algae-resistant roofing granules and has a second algae-resistance intensity. The third zone has a third algae-resistance intensity that is different from the first algae-resistance intensity.
    Type: Application
    Filed: August 1, 2023
    Publication date: February 29, 2024
    Inventors: Xiaofeng Tang, Shuang Liu, Robert L. Jenkins, Mark W. Simon
  • Patent number: 7525325
    Abstract: A passive voltage contrast (PVC) system and method are disclosed for analyzing ICs to locate defects and failure mechanisms. During analysis a device side of a semiconductor die containing the IC is maintained in an electrically-floating condition without any ground electrical connection while a charged particle beam is scanned over the device side. Secondary particle emission from the device side of the IC is detected to form an image of device features, including electrical vias connected to transistor gates or to other structures in the IC. A difference in image contrast allows the defects or failure mechanisms be pinpointed. Varying the scan rate can, in some instances, produce an image reversal to facilitate precisely locating the defects or failure mechanisms in the IC. The system and method are useful for failure analysis of ICs formed on substrates (e.g. bulk semiconductor substrates and SOI substrates) and other types of structures.
    Type: Grant
    Filed: December 18, 2006
    Date of Patent: April 28, 2009
    Assignee: Sandia Corporation
    Inventors: Mark W. Jenkins, Edward I. Cole, Jr., Paiboon Tangyunyong, Jerry M. Soden, Jeremy A. Walraven, Alejandro A. Pimentel
  • Patent number: 6902701
    Abstract: A chemical-sensing apparatus is formed from the combination of a chemical preconcentrator which sorbs and concentrates particular volatile organic chemicals (VOCs) and one or more chemiresistors that sense the VOCs after the preconcentrator has been triggered to release them in concentrated form. Use of the preconcentrator and chemiresistor(s) in combination allows the VOCs to be detected at lower concentration than would be possible using the chemiresistor(s) alone and further allows measurements to be made in a variety of fluids, including liquids (e.g. groundwater). Additionally, the apparatus provides a new mode of operation for sensing VOCs based on the measurement of decay time constants, and a method for background correction to improve measurement precision.
    Type: Grant
    Filed: October 9, 2001
    Date of Patent: June 7, 2005
    Assignee: Sandia Corporation
    Inventors: Robert C. Hughes, Ronald P. Manginell, Mark W. Jenkins, Richard Kottenstette, Sanjay V. Patel
  • Patent number: D391854
    Type: Grant
    Filed: April 11, 1997
    Date of Patent: March 10, 1998
    Assignee: Hoover Universal, Inc.
    Inventors: Donald H. Ankney, James R. Conger, Wendell R. Deaton, Scott C. Howland, Mark W. Jenkins, Matthew J. Simpson, David J. Skala, Alan W. Vanover, David R. Weinberg