Patents by Inventor Mark W. Kimmel

Mark W. Kimmel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High-throughput chiral detector and methods for using same
    Patent number: 7301633
    Abstract: A new generation polarimetry apparatus and methodology is disclosed, which involve passing polarized light through a sample including a chiral analyte, where the analyte is under the influence of a periodically varying magnetic field. The apparatus also utilizes optical heterodyne detection and lock-in detection at higher order harmonics of the magnetic field modulation frequency to improve sensitivity and detection limits of optical properties of chiral analytes.
    Type: Grant
    Filed: October 1, 2002
    Date of Patent: November 27, 2007
    Assignee: Georgia Institute of Technology
    Inventors: Phillip Ray Gibbs, Rick P. Trebino, Andreas Sebastian Bommarius, Mark W. Kimmel
  • Gated frequency-resolved optical imaging with an optical parametric amplifier
    Patent number: 5936739
    Abstract: A system for detecting objects in a turbid media utilizes an optical parametric amplifier as an amplifying gate for received light from the media. An optical gating pulse from a second parametric amplifier permits the system to respond to and amplify only ballistic photons from the object in the media.
    Type: Grant
    Filed: January 29, 1997
    Date of Patent: August 10, 1999
    Assignee: Sandia Corporation
    Inventors: Stewart M. Cameron, David E. Bliss, Mark W. Kimmel, Daniel R. Neal