Patents by Inventor Mark Windoloski

Mark Windoloski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11841245
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Grant
    Filed: January 6, 2023
    Date of Patent: December 12, 2023
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Publication number: 20230160728
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Application
    Filed: January 6, 2023
    Publication date: May 25, 2023
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Patent number: 11549831
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Grant
    Filed: September 16, 2019
    Date of Patent: January 10, 2023
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Publication number: 20220412918
    Abstract: Eddy current sensing is governed by the diffusion equation of magnetoquasistatic fields. As such the eddy current sensor's proximity to the object to be inspected (i.e., “liftoff”) significantly affects the sensor's response signal. Methods and apparatus are disclosed for improving performance for an eddy current sensor, though they may also be used for other sensor types. These solutions are beneficial for both single channel eddy current sensors and arrays, and are particularly beneficial for measuring parts with complex surfaces. In some aspects improved performance is achieved by varying the stiffness of the mechanical support for the sensor. Some mechanical supports may exhibit anisotropic stiffness. After performing a scan with an eddy current array, a multi-channel shape filtering module is applied to improve defect detection. The module reduces the variability of defect response measured due to the unpredictability of the defect location transverse to the scan direction.
    Type: Application
    Filed: September 5, 2022
    Publication date: December 29, 2022
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Mark Windoloski, Todd M Dunford
  • Publication number: 20220373367
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Application
    Filed: September 16, 2019
    Publication date: November 24, 2022
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Publication number: 20220358630
    Abstract: A system and method are disclosed for enhancing pit detection and sizing in a test object. Response signatures are created and stored in a signature library to characterize various sensor responses (liftoff, orientation) and pit properties (e.g., depth, width), possibly with or without additional considerations (e.g., edges, cracks). A sensor is placed on and scanned across a surface of interest on the test object. During scanning the sensor is measured repeatedly at regular intervals. An encoder may be used to record the sensor position for each measurement. The measurement results are then correlated with one or more signatures in the signature library. A threshold is used to determine if the correlation is indicative of the detection of a pit. If so additional processing may be performed to estimate pit properties.
    Type: Application
    Filed: May 9, 2022
    Publication date: November 10, 2022
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Mark Windoloski
  • Publication number: 20210080297
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Application
    Filed: September 16, 2019
    Publication date: March 18, 2021
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Publication number: 20070272042
    Abstract: A set of curved components, such as the dovetail region of engine blades, are inspected by mounting each component into a circular carousel in a vertical orientation and rotating the carousel to move each component toward and away from an inspection site. The inspection site clamps a flexible eddy current sensor array to the curved material surface, scans the array over the surface, records the sensor position. A rigid element having a surface geometry similar to the surface shape of the component can be attached to the component to facilitate scanning of the sensor array over a component edge. The response of each sense element in the array may be converted into an effective material property and sense element proximity to the component material surface to verify the quality of the inspection scan and the presence of a defect such as a crack.
    Type: Application
    Filed: March 7, 2007
    Publication date: November 29, 2007
    Inventors: Neil Goldfine, Mark Windoloski, Vladimir Tsukernik, Darrell Schlicker, Todd Dunford, Andrew Washabaugh
  • Publication number: 20070227255
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Application
    Filed: January 25, 2007
    Publication date: October 4, 2007
    Inventors: Neil Goldfine, Vladimir Zilberstein, David Grundy, Andrew Washabaugh, Darrell Schlicker, Ian Shay, Robert Lyons, Christopher Craven, Christopher Root, Mark Windoloski, Volker Weiss
  • Publication number: 20070069720
    Abstract: Nondestructive material condition monitoring and assessment is accomplished by placing, mounting, or scanning magnetic and electric field sensors and sensor arrays over material surfaces. The material condition can be inferred directly from material property estimates, such as the magnetic permeability, dielectric permittivity, electrical property, or thickness, or from a correlation with these properties. Hidden cracks in multiple layer structures in the presence of fasteners are detected by combining multiple frequency magnetic field measurements and comparing the result to characteristic signature responses. The threshold value for indicating a crack is adjusted based on a high frequency measurement that accounts for fastener type. The condition of engine disk slot is determined without removal of the disk from the engine by placing near the disk a fixture that contains a sensor for scanning through the slot and means for recording position within the slot.
    Type: Application
    Filed: September 19, 2005
    Publication date: March 29, 2007
    Inventors: Neil Goldfine, Mark Windoloski, David Grundy, Yanko Sheiretov, Darrell Schlicker, Andrew Washabaugh
  • Publication number: 20060244443
    Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
    Type: Application
    Filed: January 30, 2006
    Publication date: November 2, 2006
    Inventors: Neil Goldfine, Andrew Washabaugh, Yanko Sheiretov, Darrell Schlicker, Robert Lyons, Mark Windoloski, Christopher Craven, Vladimir Tsukernik, David Grundy
  • Publication number: 20060186880
    Abstract: An automated drawing tool and a method for drawing a sensor layout. A sensor is drawn by selecting a sensor family, each sensor of the sensor family having at least one drive element to impose a magnetic field in a test material when driven by an electric signal, and at least one sense element for sensing a response of the test material. A set of layout rules are associated with the sensor family and are used in determining a sensor-layout. The automated drawing tool processes input information and the layout rules, for the sensor family, to automatically draw the sensor.
    Type: Application
    Filed: April 20, 2006
    Publication date: August 24, 2006
    Inventors: Darrell Schlicker, Neil Goldfine, Andrew Washabaugh, Karen Walrath, Ian Shay, David Grundy, Mark Windoloski
  • Patent number: 7049811
    Abstract: A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: May 23, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Publication number: 20060097718
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Application
    Filed: October 11, 2005
    Publication date: May 11, 2006
    Inventors: Darrell Schlicker, Neil Goldfine, Andrew Washabaugh, Yanko Sheiretov, Mark Windoloski
  • Publication number: 20060076952
    Abstract: Apparatus and methods are described for assessing material condition through magnetic field measurements that provide material property information at multiple depths into the material. The measurements are obtained from sense elements located at different distances from an excitation drive winding, with the area of each sense element adjusted so that the flux of magnetic field through each sense element is approximately the same when over a reference material. These sense element responses can be combined, for example by subtraction, to enhance sensitivity to hidden features, such as cracks beneath fastener heads, while reducing the influence from variable effects, such as fastener material type and placement. Measurement responses can also be converted into effective material properties, using a model that accounts for known properties of the sensor and test material, which are then correlated with the size of the surface breaking or hidden features.
    Type: Application
    Filed: February 11, 2005
    Publication date: April 13, 2006
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, David Grundy, Mark Windoloski, Ian Shay, Andrew Washabaugh
  • Publication number: 20050248339
    Abstract: Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided every other half wavelength may be connected together in series while the sensing elements in adjacent half wavelengths are spatially offset. Certain sensors include circular segments which create a circularly symmetric magnetic field that is periodic in the radial direction. Such sensors are particularly adapted to surround fasteners to detect cracks and can be mounted beneath a fastener head. In another sensor, sensing windings are offset along the length of parallel winding segments to provide material measurements over different locations when the circuit is scanned over the test material.
    Type: Application
    Filed: February 11, 2005
    Publication date: November 10, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, David Grundy, Mark Windoloski, Ian Shay, Andrew Washabaugh
  • Publication number: 20050127908
    Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.
    Type: Application
    Filed: October 12, 2004
    Publication date: June 16, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell Schlicker, Neil Goldfine, David Grundy, Robert Lyons, Vladimir Zilberstein, Andrew Washabaugh, Vladimir Tsukernik, Mark Windoloski, Ian Shay
  • Publication number: 20050083032
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Application
    Filed: September 8, 2004
    Publication date: April 21, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, David Grundy, Andrew Washabaugh, Darrell Schlicker, Ian Shay, Robert Lyons, Christopher Craven, Christopher Root, Mark Windoloski, Volker Weiss
  • Publication number: 20050017713
    Abstract: Eddy current sensors and sensor arrays are used to characterize welds and the welding process schedule or parameters. A sensor or sensor array is placed in proximity to the test material, such as a lap joint or a butt weld, and translated over the weld region. Effective properties associated with the test material and sensor, such as an electrical conductivity or lift-off, are obtained for the weld region and the base material at a distant location from the weld region. The effective properties or features obtained from the effective property variation with position across the weld are used to assess the welding process parameters.
    Type: Application
    Filed: June 9, 2004
    Publication date: January 27, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, David Grundy, Vladimir Zilberstein, Mark Windoloski, Darrell Schlicker, Andrew Washabaugh
  • Publication number: 20050007106
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Application
    Filed: May 24, 2004
    Publication date: January 13, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, Andrew Washabaugh, Ian Shay, Mark Windoloski, Christopher Root, Vladimir Zilberstein, David Grundy, Vladimir Tsukernik