Patents by Inventor Marko Banzet

Marko Banzet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8919212
    Abstract: A sensor array for measuring the deformation of an area caused by a force, comprises a first strip and a second strip arranged in the same plane on the area so as to form a tunnel junction of which at least the first strip is movably arranged on the area so that the gap between the two strips is increased when the area is deformed as a result of the action of the force.
    Type: Grant
    Filed: July 9, 2011
    Date of Patent: December 30, 2014
    Assignee: Forschungszentrum Juelich GmbH
    Inventors: Herbert Bousack, Helmut Soltner, Dirk Mayer, Marko Banzet
  • Publication number: 20130205919
    Abstract: A sensor array for measuring the deformation of an area caused by a force, comprises a first strip and a second strip arranged in the same plane on the area so as to form a tunnel junction of which at least the first strip is movably arranged on the area so that the gap between the two strips is increased when the area is deformed as a result of the action of the force.
    Type: Application
    Filed: July 19, 2011
    Publication date: August 15, 2013
    Inventors: Herbert Bousack, Helmut Soltner, Dirk Mayer, Marko Banzet
  • Publication number: 20050116719
    Abstract: The invention relates to a component for a SQUID microscope and to a SQUID microscope. The aim of the invention is to provide a SQUID microscope which allows the adjustment of a very small distance between the sample and the microscope tip. The invention provides a substrate that has an edge. The closed-loop track that couples the sample to the SQUID and transmits the magnetic flux is led across said edge. The two faces of the substrate defining the edge form an angle that ranges between 90 and 180°. The provision of this angle makes it possible to bring the substrate together with the closed-loop track closer to the window of a vacuum chamber than previously. The sample to be tested is disposed behind said window.
    Type: Application
    Filed: November 19, 2002
    Publication date: June 2, 2005
    Inventors: Mehdi Fardmanesh, Jurgen Schubert, Marko Banzet
  • Patent number: 6300760
    Abstract: In an arrangement for coupling an rf-SQUID to a superconducting tank circuit and to a base plate, in which the tank circuit and the rf-SQUID form a coplanar structure and the tank circuit has a slit, the base plate (10) is configured as an outer loop (10a) coplanar to the rf-SQUID (2) and the tank circuit (1) and has a slit (11), and the tank circuit (1) comprises an inner loop (1a) in which the slit (4) is embodied, whereby the orientation of the slits (4, 11) of the inner loop (1a) and the outer loop (10a) relative to one another determines the resonance frequency fr.
    Type: Grant
    Filed: May 26, 1999
    Date of Patent: October 9, 2001
    Assignee: Forschungszentrum Jülich GmbH
    Inventors: Jürgen Schubert, Yi Zhang, Willi Zander, Marko Banzet, Huai-ren Yi, Xianghui Zeng
  • Patent number: 6225800
    Abstract: An arrangement for coupling an rf-SQUID magnetometer to a superconductive tank circuit on a substrate is constructed in such a way that the two components are fully integrated into each other. Such integration increases the quality of the tank circuit by a factor of 2 to 3 as opposed to an arrangement obtainable by the flip-chip technology. Furthermore, the integrated arrangement permits simple assessment of coupling “k” between the SQUID and the tank circuit.
    Type: Grant
    Filed: September 25, 1998
    Date of Patent: May 1, 2001
    Assignee: Forschungszentrum Jülich GmbH
    Inventors: Yi Zhang, Jürgen Schubert, Willi Zander, Helmut Soltner, Marko Banzet